AFM is a technique widely used for probing the topography of surfaces at much higher magnifications than those achieved using a traditional optical microscope. The technique relies on the interaction of atoms on a surface with a small sharp tip as it is rastered across the surface causing very small movements of the tip.

The popularity of the technique is due to the wide range of samples it can successfully be applied to and the large amount of information that can be collected in conjunction with a topography map.

Atomic Force Microscopy Facilities

The Department of Materials has a Bruker Innova Atomic Force Microscope capable of several analysis modes including:

  • Contact Mode AFM
  • Tapping Mode AFM
  • STM
  • C-AFM
  • LFM
  • Nanoindentation