High Pressure Photoelectron Spectroscopy (HiPPES)
UPS at UHV and XPS at UHV and high pressure conditions (up to 25 mbar)
X-ray photoelectron spectroscopy (XPS) and ultra-violet photoelectron spectroscopy (UPS) are fundamental techniques in the analysis of the surfaces of materials providing key information on their elemental composition and electronic properties.
The system, built by VG Scienta, is equipped with a high pressure retractable cell, designed to provide flexibility between near-ambient pressure and UHV conditions. This greatly reduces the “pressure gap” that often distances traditional UHV XPS analysis from real world applications.
The system is equipped with state of the art monochromated X-ray and UV sources and an hemispherical electron energy analyser capable of operating from UHV up to 25 mbar (XPS only) while dosing a variety of gases (air, N2, O2, H2, H2O, CO2, etc) or gas mixtures.
- VG Scienta R4000 HiPP-2 XPS/UPS analyser, MX650 monochromated x-ray source, VG Scienta VUV5000 monochromated UV source and FG300 flood gun for charge compensation
- Sample analysis Temperature = -140 to 1000 ˚C
- Preparation chamber: Argon sputter, electron beam annealing and LEED optics.