This electron microscope combines high resolution TEM and STEM imaging with nano-analytical capabilities for a high-throughput facility with wide-ranging materials re-quirements.

The microscope is equipped with a Cs aber-ration (image) corrector giving 70 pm for the information limit and 130 pm spatial resolution for STEM. The instru-ment is also equipped with a monochromator which gives an energy resolution of 0.6 eV (mono off)/0.12 eV (mono on). The microscope is routinely operated at 80, 200 and 300 kV depending on sample requirements. The instrument is equipped with a windowless Bruker XFlash EDS detector, Gatan Tridiem GIF for EELS ac-quisition and nano-diffraction capabilities, providing chemical and analytical information on the nanoscale. Additionally, there are a number of holders for the micro-scope include a tomography holder and heating and cooling rods.

Titan 80/300 TEM/STEM help and support

  • Dr Catriona McGilvery

    Dr Catriona McGilvery, Department of Materials, Imperial College London

    Personal details

    Dr Catriona McGilvery Research Officer in Electron Microscopy

    +44 020 7594 2579


    Department of Materials
    Royal School of Mines
    Lower Ground Floor, LGM 05K