Electrical testing

Agilent 4287A RF LCR meter

Agilent 4287A RF LCR meter

Agilent 4287A RF LCR meter offers accurate, reliable and fast measurements from 1 MHz to 3 GHz to improve quality and throughput of electronic component testing in production lines. The 4287A employs the direct-current voltage-measurement technique, as opposed to the reflection-measurement technique, which yields accurate measurements over a wide impedance range.

Agilent 8722ES vector network analyzer

Agilent 8722ES vector network analyzer

Agilent 8722ES vector network analyzer covers the frequency range of 300 kHz to 50 GHz, and allows complete characterization of RF and microwave components. The 8722ES includes an integrated synthesized source, test set and tuned receiver. The built-in S-parameter test set provides a full range of magnitude and phase measurements in both the forward and reverse directions. Built-in vector accuracy enhancement techniques include full two-port, adapter-removal, and optional TRL calibration.

Electrical testing 2

Agilent B1500A Semiconductor Device Analyzer

Agilent B1500A Semiconductor Device Analyzer

Agilent B1500A Semiconductor Device Analyzer is an all in one analyzer that supports Current-voltage (IV) measurements of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 µV - 200 V; and AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV)IV, CV, pulse/dynamic IV measurements and more. It is designed for all-round characterization from basic to cutting-edge applications and it provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.

Keithley 2634B SourceMeter

Keithley 2634B SourceMeter

Keithley 2634B SourceMeter is a dual-channel SMU instrument with best-in-class value and performance. Its tightly-integrated, four-quadrant design allows it to simultaneously source and measure both voltage and current to boost productivity in R&D and bench-top applications. The wide range of 1.5A DC, 10A pulse, 200V output and 1fA measurement resolution makes it suitable to test a wide range of lower current devices and materials. The Model 2634B is equipped with Keithley's high speed TSP technology, which is over 190% faster than traditional PC-to-instrument communication techniques. The Model 2634B is designed for bench-top applications and, therefore, does not have the high-end, system-level automation features of the Model 2636B SourceMeter SMU Instrument that includes digital I/O, TSP-Link technology, and contact check function.