The Dektak 150 is a contact mode profilometer with the function to measure the thickness of thin films. It demonstrates, while comprising of a range of configurations and add-on options for supe-rior programmability, repeatability detailed analysis and low-force characterisation.

It is able to perform 55 mm long scans on up to 90 mm thick samples fitted on 150 mm (in diame-ter) vacuum chuck.

Veeco Dektak 150 Stylus Profiler
Veeco Dektak 150 Stylus Profiler

Veeco Dektak 150 Stylus Profiler help and support

  • Dr Peter Petrov

    Dr Peter Petrov, Department of Materials, Imperial College London

    Personal details

    Dr Peter Petrov Principal Research Scientist Thin Film Laboratory

    +44 (0)20 7594 8156

    Support with

    General enquiries, users registrations and academic research in Thin Film Technology

    Location

    Department of Materials
    Bessemer Building (though the TYC/ LCN corridor)
    Ground Floor, B333