BibTex format

author = {Wood, S and Hollis, JR and Kim, J-S},
doi = {7/073001},
journal = {Journal of Physics D: Applied Physics},
title = {Raman spectroscopy as an advanced structural nanoprobe for conjugated molecular semiconductors},
url = {},
volume = {50},
year = {2017}

RIS format (EndNote, RefMan)

AB - Raman spectroscopy has emerged as a powerful and important characterisation tool for probing molecular semiconducting materials. The useful optoelectronic properties of these materials arise from the delocalised π-electron density in the conjugated core of the molecule, which also results in large Raman scattering cross-sections and a strong coupling between its electronic states and vibrational modes. For this reason, Raman spectroscopy offers a unique insight into the properties of molecular semiconductors, including: chemical structure, molecular conformation, molecular orientation, and fundamental photo- and electro-chemical processes—all of which are critically important to the performance of a wide range of optical and electronic organic semiconductor devices. Experimentally, Raman spectroscopy is non-intrusive, non-destructive, and requires no special sample preparation, and so is suitable for a wide range of in situ measurements, which are particularly relevant to issues of thermal and photochemical stability. Here we review the development of the family of Raman spectroscopic techniques, which have been applied to the study of conjugated molecular semiconductors. We consider the suitability of each technique for particular circumstances, and the unique insights it can offer, with a particular focus on the significance of these measurements for the continuing development of stable, high performance organic electronic devices.
AU - Wood,S
AU - Hollis,JR
AU - Kim,J-S
DO - 7/073001
PY - 2017///
SN - 0022-3727
TI - Raman spectroscopy as an advanced structural nanoprobe for conjugated molecular semiconductors
T2 - Journal of Physics D: Applied Physics
UR -
UR -
UR -
VL - 50
ER -