chip_id: CBIT16E01_CANDO1


Technology: AMS 0.35μm 2P4M CMOS (H35B4S1) 

Silicon Area: 5mm × 3.75mm

Description: Test circuits for CANDO optrode including recording sub-system, and test structures for long-term reliability testing.

Designers: Dorian Haci, Federico Mazza, Yan Liu, Timothy Constandinou

Tape-out: May 2016

Link to project page for further details

CBIT16E01_CANDO3_Test1 Neural Recording+Test Circuits (Gen.2)

References

  • N/A