chip_id: CBIT16E01_CANDO5


Technology: AMS 0.35μm 2P4M CMOS (H35B4S1) 

Silicon Area: 4mm × 3.75mm

Description: Test circuits for CANDO optrode including 4-wire communication sub-system, non-volatile memory, and test structures for long-term reliability testing.

Designers: Dorian Haci, Federico Mazza, Sara Ghoreishizadeh, Yan Liu, Timothy Constandinou

Tape-out: May 2016

Link to project page for further details

CBIT16E01_CANDO3_Test5 4-Wire Interface+Test Circuits

References