chip_id: CBIT17F02_CandoTest


Technology: AMS 0.35μm 2P4M CMOS (C35B4C3)

Silicon Area: 2mm × 3.5mm

Description: Test structures for reliability testing of implantable packaging and CT ADC design.

Designers: Federico Mazza, Yan Liu

Tape-out: June 2017

Link to project page for further details

CBIT17F02 CANDO Test

References