BibTex format
@article{Tellez:2014:10.1039/C3JA50292A,
author = {Tellez, H and Aguadero, A and Druce, J and Burriel, M and Fearn, S and Kilner, J and McPhail, D},
doi = {10.1039/C3JA50292A},
journal = {Journal of Analytical Atomic Spectrometry},
pages = {1361--1370},
title = {New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)},
url = {http://dx.doi.org/10.1039/C3JA50292A},
volume = {29},
year = {2014}
}