Imperial College London

Professor David W. McComb

Faculty of EngineeringDepartment of Materials

Adjunct Professor
 
 
 
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Contact

 

+44 (0)20 7594 6750d.mccomb Website

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Publication Type
Year
to

293 results found

Jantou V, McComb DW, Horton MA, 2008, Analytical transmission electron microscopy of mineralised dentin, Electron Microscopy and Analysis Group Conference, Publisher: IOP PUBLISHING LTD, ISSN: 1742-6588

Conference paper

Berhanu S, McLachlan MA, McComb DW, Jones TSet al., 2008, Colloidal Crystals as Nanostructured Templates for Organic Solar Cells, Conference on Organic Photovoltaics IX, Publisher: SPIE-INT SOC OPTICAL ENGINEERING, ISSN: 0277-786X

Conference paper

McGilvery CM, McFadzean S, MacKenzie M, Docherty FT, Craven AJ, McComb DW, De Gendt Set al., 2008, Nucleation, Crystallisation and Phase Segregation in HfO2 and HfSiO, 15th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 325-+, ISSN: 0930-8989

Conference paper

McGilvery CM, McComb DW, MacKenzie M, Craven AJ, McFadzean S, De Gendt Set al., 2008, Analysis of hafnium containing powders and thin films for CMOS device applications, Electron Microscopy and Analysis Group Conference, Publisher: IOP PUBLISHING LTD, ISSN: 1742-6588

Conference paper

Kadkhodazadeh S, Ashwin MJ, Jones TS, McComb DWet al., 2008, Towards measuring bandgap inhomogeneities in InAs/GaAs quantum dots, Electron Microscopy and Analysis Group Conference, Publisher: IOP PUBLISHING LTD, ISSN: 1742-6588

Conference paper

Husain S, McComb DW, Perkins JM, Haswell Ret al., 2008, Sample preparation and electron microscopy of hydrocracking catalysts, Electron Microscopy and Analysis Group Conference, Publisher: IOP PUBLISHING LTD, ISSN: 1742-6588

Conference paper

McLachlan MA, McComb DW, Ying A, Kilner JA, Skinner SAet al., 2008, Engineered Nanocomposites for Solid Oxide Fuel Cells By Colloidal Crystal Templating

Conference paper

Lekstrom M, McLachlan MA, Husain S, McComb DW, Shollock BAet al., 2008, Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument, Electron Microscopyv and Analysis Group Conference2 007(EMAG2007), Publisher: Institute of Physics

Conference paper

McLachlan MA, Barron CCA, Johnson NP, De La Rue RM, McComb DWet al., 2008, Preparation of large area three-dimensionally ordered macroporous thin films by confined infiltration and crystallisation, Journal of Crystal Growth, Vol: 310, Pages: 2644-2646

Journal article

Barquin LF, Calderon RG, Farago B, Rodriguez-Carvajal J, Bleloch A, McComb D, Chater R, Pankhurst QAet al., 2007, Neutron spin echo evidence of mesoscopic spin correlations among Fe(Cu) ferromagnetic nanoparticles in a silver diamagnetic matrix, PHYSICAL REVIEW B, Vol: 76, ISSN: 2469-9950

Journal article

Magnus F, Clowes SK, Gilbertson AM, Branford WR, Barkhoudarov ED, Cohen LF, Singh LJ, Barber ZH, Blamire MG, Buckle PD, Buckle L, Ashley T, Eustace DA, McComb DWet al., 2007, Electrical characterization of MgO tunnel barriers grown on InAs (001) epilayers, APPLIED PHYSICS LETTERS, Vol: 91, ISSN: 0003-6951

Journal article

Perkins JM, Blom DA, Allard LF, McComb DWet al., 2007, Functional Remote Microscopy via the AtlanTICC Alliance, Microscopy and Microanalysis, Vol: 13, ISSN: 1431-9276

Journal article

Singh LJ, Oliver RA, Barber ZH, Eustace DA, McComb DW, Clowes SK, Gilbertson AM, Magnus F, Branford WR, Cohen LF, Buckle L, Buckle PD, Ashley Tet al., 2007, Preparation of InAs(001) surface for spin injection via a chemical route, JOURNAL OF PHYSICS D-APPLIED PHYSICS, Vol: 40, Pages: 3190-3193, ISSN: 0022-3727

Journal article

McLachlan MA, McComb DW, Berhanu S, Jones TSet al., 2007, Template directed synthesis of nanostructured phthalocyanine thin films, JOURNAL OF MATERIALS CHEMISTRY, Vol: 17, Pages: 3773-3776, ISSN: 0959-9428

Journal article

MacKenzie M, Craven AJ, McComb DW, De Gendt S, Docherty FT, McGilvery CM, McFadzean Set al., 2007, Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation, ELECTROCHEMICAL AND SOLID STATE LETTERS, Vol: 10, Pages: G33-G35, ISSN: 1099-0062

Journal article

Barron CCA, McLachlan MA, Zhang Q, McComb DWet al., 2007, Ferroelectric Three-Dimensionally Ordered Macroporous Thin Films, Pages: 43-52

Conference paper

MacKenzie M, Craven AJ, McComb DW, De Gendt S, Docherty FT, McGilvery CM, McFadzean Set al., 2006, Advanced nano-analysis of a high-k dielectric stack, Pages: 153-158, ISSN: 1938-5862

Analytical electron microscopy techniques are used to investigate elemental distributions across a high-k dielectric stack with a metal gate. Electron energy-loss spectroscopy results from a Si(100)/SiO2/HfO 2/TiN/a-Si gate stack prior to activation show evidence of interface reactions having occurred with the formation of an oxide layer at the TiN/a-Si interface. copyright The Electrochemical Society.

Conference paper

Litvinenko KL, Murdin BN, Allam J, Pidgeon CR, Zhang T, Harris JJ, Cohen LF, Eustace DA, McComb DWet al., 2006, Spin lifetime in InAs epitaxial layers grown on GaAs, PHYSICAL REVIEW B, Vol: 74, ISSN: 1098-0121

Journal article

Jin C, Li Z-Y, McLachlan MA, McComb DW, De La Rue RM, Johnson NPet al., 2006, Optical properties of tetragonal photonic crystal synthesized via template-assisted self-assembly, JOURNAL OF APPLIED PHYSICS, Vol: 99, ISSN: 0021-8979

Journal article

MacKenzie M, Craven AJ, McComb DW, De Gendt Set al., 2006, Interfacial reactions in a HfO2/TiN/poly-Si gate stack, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951

Journal article

MacKenzie M, Craven AJ, McComb DW, De Gendt Set al., 2006, Interfacial reactions in a HfO2/TiN/poly-Si gate stack (Article no.192112), Applied Physics Letters, Vol: 88, Pages: 1-3, ISSN: 0003-6951

Journal article

MacKenzie M, Craven AJ, Hamilton DA, McComb DWet al., 2006, Electron energy-loss spectrum imaging of high-k dielectric stacks, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951

Journal article

Cunningham D, Littleford RE, Smith WE, Lundahl PJ, Khan I, McComb DW, Graham D, Laforest Net al., 2006, Practical control of SERRS enhancement, FARADAY DISCUSSIONS, Vol: 132, Pages: 135-145, ISSN: 1364-5498

Journal article

MacKenzie M, Craven AJ, McComb DW, De Gendt Set al., 2006, Advanced nanoanalysis of high-k dielectric stacks, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, Vol: 153, Pages: F215-F218, ISSN: 0013-4651

Journal article

Khan IR, Cunningham D, Lazar S, Graham D, Smith WE, McComb DWet al., 2006, A TEM and electron energy loss spectroscopy (EELS) investigation of active and inactive silver particles for surface enhanced resonance Raman spectroscopy (SERRS), FARADAY DISCUSSIONS, Vol: 132, Pages: 171-178, ISSN: 1364-5498

Journal article

Eustace DA, Docherty FT, McComb DW, Craven AJet al., 2006, ELNES as a probe of magnetic order in mixed oxides, EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale, Publisher: IOP PUBLISHING LTD, Pages: 165-+, ISSN: 1742-6588

Conference paper

T Docherty F, MacKenzie M, Pennicard D, Craven AJ, McComb DWet al., 2006, Understanding and preventing beam damage effects in partially processed high-k gate stacks, EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale, Publisher: IOP PUBLISHING LTD, Pages: 231-+, ISSN: 1742-6588

Conference paper

Khan I, Cunningham D, Littleford RE, Graham D, Smith WE, McComb DWet al., 2006, From micro to nano: Analysis of surface-enhanced resonance Raman spectroscopy active sites via multiscale correlations, ANALYTICAL CHEMISTRY, Vol: 78, Pages: 224-230, ISSN: 0003-2700

Journal article

MacKenzie M, Craven AJ, McComb DW, De Gendt Set al., 2005, Advanced nano-analysis of high-k dielectric stacks, Pages: 323-329, ISSN: 1938-5862

Analytical electron microscopy techniques are used to investigate elemental distributions across high-k dielectric stacks with metal gates. Electron energy loss spectroscopy results from Si(100)/SiO2/HfO2/TiN and Si(100)/SiO2/HfO2/TiN/poly-Si gate stacks show evidence of interface reactions having occurred at the TiN/poly-Si interface and possibly at the Hfo2/TiN interfaces. As such, this technique offers unique capabilities to further improve understanding of the work function behavior of metal gate electrode/dielectric stacks to be used in future CMOS technologies. copyright The Electrochemical Society.

Conference paper

Jin CJ, McLachlan MA, McComb DW, De La Rue RM, Johnson NPet al., 2005, Template-assisted growth of nominally cubic (100)-oriented three-dimensional crack-free photonic crystals, NANO LETTERS, Vol: 5, Pages: 2646-2650, ISSN: 1530-6984

Journal article

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