Imperial College London
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Professor David W. McComb

Faculty of Engineering, Department of Materials

Adjunct Professor
 
 
 
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Contact

 

+44 (0)20 7594 6750d.mccomb Website

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Williams:2019:10.1557/mrs.2019.286,
author = {Williams, REA and Mccomb, DW and Subramaniam, S},
doi = {10.1557/mrs.2019.286},
journal = {MRS Bulletin},
pages = {929--934},
title = {Cryo-electron microscopy instrumentation and techniques for life sciences and materials science},
url = {http://dx.doi.org/10.1557/mrs.2019.286},
volume = {44},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - In this article, we review some of the recent developments in instrumentation and methods that have led to the rise of cryo-electron microscopy (cryo-EM) in the life sciences community, and consider how researchers in the materials community might benefit from these advances. Transmission electron microscopy (TEM) is compared with scanning transmission electron microscopy (STEM) for cryogenic imaging in both biological and materials science applications. We discuss the developments in detector technologies that have in part powered the development of cryo-EM and anticipate exciting areas for productive overlap between life science and materials science cryo-EM applications.
AU  - Williams,REA
AU  - Mccomb,DW
AU  - Subramaniam,S
DO  - 10.1557/mrs.2019.286
EP  - 934
PY  - 2019///
SN  - 0883-7694
SP  - 929
TI  - Cryo-electron microscopy instrumentation and techniques for life sciences and materials science
T2  - MRS Bulletin
UR  - http://dx.doi.org/10.1557/mrs.2019.286
VL  - 44
ER  -
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