Publications
140 results found
McPhail DS, Harvey P, Ortona F, 2003, Incorporating skills teaching into science degrees: a review and case study, Proceedings of the 2003 WFEO/ASEE e-Conference
Gaspar P, Hubbard C, McPhail DS, et al., 2003, A topographical assessment and comparison of conservation cleaning treatments, Journal of Cultural Heritage, Vol: 4, Pages: 294-302, ISSN: 1296-2074
Sokhan M, Gaspar, Pedro, et al., 2003, Initial results on laser cleaning at the Victoria & Albert Museum, Natural History Museum and Tate Gallery, Journal of Cultural Heritage, Vol: 4, Pages: 230-236, ISSN: 1296-2074
Berenov A, Farvacque C, Qi X, et al., 2002, Ca doping of YBCO grain boundaries, 5th European Conference on Applied Superconductivity (EUCAS 2001), Publisher: ELSEVIER SCIENCE BV, Pages: 1059-1062, ISSN: 0921-4534
Graham GA, Chater RJ, McPhail DS, et al., 2002, In situ sectioning and analysis of cosmic dust using focused ion beam microscopy., METEORITICS & PLANETARY SCIENCE, Vol: 37, Pages: A56-A56, ISSN: 1086-9379
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- Citations: 4
Rees EE, Ryan MP, McPhail DS, 2002, An STM study of the nanocrystalline structure of the passive film on iron, ELECTROCHEMICAL AND SOLID STATE LETTERS, Vol: 5, Pages: B21-B23, ISSN: 1099-0062
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- Citations: 23
Srnanek R, Vincze A, Kovac J, et al., 2002, A Raman study of GaAsN, GaInAsN layers on bevelled samples, 9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX), Publisher: ELSEVIER SCIENCE SA, Pages: 87-90, ISSN: 0921-5107
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- Citations: 10
Ryan MP, Williams DE, Chater RJ, et al., 2002, Why stainless steel corrodes, NATURE, Vol: 415, Pages: 770-774, ISSN: 0028-0836
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- Citations: 516
Srnanek R, Kinder R, Sciana B, et al., 2001, Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy, APPLIED SURFACE SCIENCE, Vol: 177, Pages: 139-145, ISSN: 0169-4332
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- Citations: 13
Hotovy I, Huran J, Srnanek R, et al., 2001, Study of reactive gas modulation in reactive magnetron sputtering of NiO thin films, Orleans, France, 15th international symposium on plasma chemistry, Pages: 199-204
Gurnik P, Srnanek R, McPhail DS, et al., 2001, Characterization of delta-doped GaAs grown by molecular beam epitaxy, International symposium on electron devices for microwave and optoelectronic applications, Vienna Univ Technol, Vienna, Austria, Pages: 9-14
Alibhai AA, Garriga-Majo DP, Shollock BA, et al., 2000, Novel techniques for investigating the high temperature degradation of protective coatings on nickel base superalloys, 9th International Symposium on Superalloys, Publisher: MINERALS, METALS & MATERIALS SOC, Pages: 675-684
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- Citations: 1
Srnanek R, Vincze A, McPhail DS, et al., 2000, Optical properties of GaAs based layers characterised by Raman spectroscopy and photoluminescence, Smolenice Castle, Slovakia, Pages: 307-310
Srnanek R, Hotovy I, Malcher V, et al., 2000, A Raman study of NiOx films for gas sensors applications, Smolenice Castle, Slovakia, Pages: 303-306
Garriga-Majo DP, Shollock BA, McPhail DS, et al., 1999, Novel strategies for evaluating the degradation of protective coatings on superalloys, INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, Vol: 1, Pages: 325-336, ISSN: 1466-6049
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- Citations: 17
Hughes M, McPhail DS, Chater RJ, et al., 1999, High sensitivity FIB-SIMS analysis of semiconductor devices, Microscopy of Semiconducting Materials 1999, Pages: 603-606
Johansen KP, McPhail DS, Fearn S, 1999, Chemical bevelling and SIMS linescan analysis of low energy boron implanted silicon, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 465-468, ISSN: 0951-3248
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- Citations: 1
Hughes M, McPhail DS, Chater RJ, et al., 1999, High sensitivity FIB-SIMS analysis of semiconductor devices, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 603-606, ISSN: 0951-3248
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- Citations: 2
Johansen KP, McPhail DS, Fearn S, 1999, Chemical bevelling and SIMS linescan analysis of low energy boron implanted silicon, Pages: 465-468
Montgomery NJ, MacManus-Driscoll JL, McPhail DS, et al., 1998, High-resolution secondary ion mass spectrometry depth profiling of superconducting thin films, 5th European Vacuum Conference (EVC 5) / 10th International Conference on Thin Films (ICTF 10), Publisher: ELSEVIER SCIENCE SA, Pages: 237-240, ISSN: 0040-6090
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- Citations: 3
McPhail DS, 1997, Strategies for achieving sub-nanometre depth resolution in secondary ion mass spectrometry (SIMS), 1997 Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 97), Publisher: IOP PUBLISHING LTD, Pages: 227-232, ISSN: 0951-3248
Montgomery NJ, McPhail DS, Manus-Driscoll J, et al., 1997, Characterisation of thin film superconducting multilayers and their interphases using secondary ion mass spectrometry, Journal of Alloys and Compounds, Vol: 251, Pages: 355-359
McPhail DS, 1997, Strategies for achieving sub-nanometre depth resolution in secondary ion mass spectrometry (SIMS), Electron Microscopy and Analysis 1997, Pages: 227-232
McPhail DS, Montgomery NJ, 1996, Topography development on single crystal MgO under ion beam bombardment, Mikrochimica Acta, Vol: Suppl. 13, Pages: 419-424
McPhail DS, Hsu CM, 1996, SIMS linescan profiling of chemically bevelled semiconductors: A method of overcoming ion beam induced segregation in depth profiling, Mikrochimica Acta, Vol: Suppl. 13, Pages: 317-324
SHARMA VKM, MCPHAIL DS, FAHY MR, 1995, ION YIELD EFFECTS IN THE SIMS ANALYSIS OF SILICON DELTA-DOPED LAYERS IN GAAS, SURFACE AND INTERFACE ANALYSIS, Vol: 23, Pages: 723-728, ISSN: 0142-2421
HSU CM, SHARMA VKM, ASHWIN MJ, et al., 1995, SIMS ANALYSIS OF AL DELTA-DOPED GAAS TEST STRUCTURES USING CHEMICAL BEVELLING AS A SAMPLE PREPARATION TECHNIQUE, SURFACE AND INTERFACE ANALYSIS, Vol: 23, Pages: 665-672, ISSN: 0142-2421
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- Citations: 14
HSU CM, MCPHAIL DS, 1995, A NEWLY DEVELOPED CHEMICAL BEVELLING TECHNIQUE USED FOR DEPTH INDEPENDENT HIGH DEPTH RESOLUTION SIMS ANALYSIS, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol: 101, Pages: 427-434, ISSN: 0168-583X
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- Citations: 11
Beyer GP, McPhail DS, Khan A, et al., 1995, A Sims study of the inter-diffusion of group III atoms in a distributed Bragg reflector, NATO Advanced Study on Application of Particle and Laser Beams in Materials Technology, Publisher: KLUWER ACADEMIC PUBL, Pages: 151-158, ISSN: 0168-132X
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- Citations: 1
THOMAS EW, MCPHAIL D, 1994, COLLISIONAL DESORPTION OF CS+ AND CSX+ IONS FROM GAAS BY CS+ IMPACT, 15th International Conference on Atomic Collisions in Solids (ICACS-15), Publisher: ELSEVIER SCIENCE BV, Pages: 482-486, ISSN: 0168-583X
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- Citations: 3
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