Imperial College London

DrEmilioMartinez-Paneda

Faculty of EngineeringDepartment of Civil and Environmental Engineering

Visiting Reader
 
 
 
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Contact

 

+44 (0)20 7594 8188e.martinez-paneda Website

 
 
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Location

 

249Skempton BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Martinez-Paneda:2016:10.1016/j.tafmec.2016.09.002,
author = {Martinez-Paneda, E and Cuesta, II and Penuelas, I and Diaz, A and Alegre, JM},
doi = {10.1016/j.tafmec.2016.09.002},
journal = {Theoretical and Applied Fracture Mechanics},
pages = {51--60},
title = {Damage modeling in Small Punch Test specimens},
url = {http://dx.doi.org/10.1016/j.tafmec.2016.09.002},
volume = {86},
year = {2016}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - Ductile damage modeling within the Small Punch Test (SPT) is extensively investigated. The capabilities of the SPT to reliably estimate fracture and damage properties are thoroughly discussed and emphasis is placed on the use of notched specimens. First, different notch profiles are analyzed and constraint conditions quantified. The role of the notch shape is comprehensively examined from both triaxiality and notch fabrication perspectives. Afterwards, a methodology is presented to extract the micromechanical-based ductile damage parameters from the load-displacement curve of notched SPT samples. Furthermore, Gurson-Tvergaard-Needleman model predictions from a top-down approach are employed to gain insight into the mechanisms governing crack initiation and subsequent propagation in small punch experiments. An accurate assessment of micromechanical toughness parameters from the SPT is of tremendous relevance when little material is available.
AU - Martinez-Paneda,E
AU - Cuesta,II
AU - Penuelas,I
AU - Diaz,A
AU - Alegre,JM
DO - 10.1016/j.tafmec.2016.09.002
EP - 60
PY - 2016///
SN - 0167-8442
SP - 51
TI - Damage modeling in Small Punch Test specimens
T2 - Theoretical and Applied Fracture Mechanics
UR - http://dx.doi.org/10.1016/j.tafmec.2016.09.002
UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000389111500009&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR - http://hdl.handle.net/10044/1/73433
VL - 86
ER -