Imperial College London
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ProfessorEricYeatman

Faculty of Engineering, Department of Electrical and Electronic Engineering

Head of Department of Electrical and Electronic Engineering
 
 
 
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Contact

 

+44 (0)20 7594 6204e.yeatman CV

 
 
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Assistant

 

Ms Anna McCormick +44 (0)20 7594 6189

 
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Location

 

610aElectrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@inbook{Yeatman:2018:10.1007/978-3-319-32101-1_47,
author = {Yeatman, E},
booktitle = {Handbook of Sol-Gel Science and Technology: Processing, Characterization and Applications},
doi = {10.1007/978-3-319-32101-1_47},
pages = {1595--1605},
title = {Ellipsometry of sol-gel films},
url = {http://dx.doi.org/10.1007/978-3-319-32101-1_47},
year = {2018}
}
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RIS format (EndNote, RefMan)

TY  - CHAP
AB  - Ellipsometry is an optical method for determining the properties of thin films, using manipulation and measurement of the polarization state of reflected light. This chapter introduces the method, summarizes the optical principles and analysis involved, and describes the basic experimental arrangements. Applications and limitations of the technique are presented. A specific application, the use of ellipsometry to determine the pore size distribution in thin porous films, is then described in some detail.
AU  - Yeatman,E
DO  - 10.1007/978-3-319-32101-1_47
EP  - 1605
PY  - 2018///
SN  - 9783319320991
SP  - 1595
TI  - Ellipsometry of sol-gel films
T1  - Handbook of Sol-Gel Science and Technology: Processing, Characterization and Applications
UR  - http://dx.doi.org/10.1007/978-3-319-32101-1_47
ER  -
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