Imperial College London
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ProfessorEricYeatman

Faculty of Engineering, Department of Electrical and Electronic Engineering

Head of Department of Electrical and Electronic Engineering
 
 
 
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Contact

 

+44 (0)20 7594 6204e.yeatman CV

 
 
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Assistant

 

Ms Anna McCormick +44 (0)20 7594 6189

 
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Location

 

610aElectrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Pillatsch:2017:1361-665X/aa5a5d,
author = {Pillatsch, P and Xiao, BL and Shashoua, N and Gramling, HM and Yeatman, EM and Wright, PK},
doi = {1361-665X/aa5a5d},
journal = {Smart Materials and Structures},
title = {Degradation of bimorph piezoelectric bending beams in energy harvesting applications},
url = {http://dx.doi.org/10.1088/1361-665X/aa5a5d},
volume = {26},
year = {2017}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Piezoelectric energy harvesting is an attractive alternative to battery powering for wireless sensor networks. However, in order for it to be a viable long term solution the fatigue life needs to be assessed. Many vibration harvesting devices employ bimorph piezoelectric bending beams as transduction elements to convert mechanical to electrical energy. This paper introduces two degradation studies performed under symmetrical and asymmetrical sinusoidal loading. It is shown that besides a loss in output power, the most dramatic effect of degradation is a shift in resonance frequency which is highly detrimental to resonant harvester designs. In addition, micro-cracking was shown to occur predominantly in piezoelectric layers under tensile stress. This opens the opportunity for increased life time through compressive operation or pre-loading of piezoceramic layers.
AU  - Pillatsch,P
AU  - Xiao,BL
AU  - Shashoua,N
AU  - Gramling,HM
AU  - Yeatman,EM
AU  - Wright,PK
DO  - 1361-665X/aa5a5d
PY  - 2017///
SN  - 0964-1726
TI  - Degradation of bimorph piezoelectric bending beams in energy harvesting applications
T2  - Smart Materials and Structures
UR  - http://dx.doi.org/10.1088/1361-665X/aa5a5d
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000399563200018&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - http://hdl.handle.net/10044/1/50791
VL  - 26
ER  -
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