Imperial College London

Professor Grigorios A. Pavliotis

Faculty of Natural SciencesDepartment of Mathematics

Professor of Applied Mathematics
 
 
 
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Contact

 

+44 (0)20 7594 8564g.pavliotis Website

 
 
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Location

 

736aHuxley BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Durán-Olivencia:2019:10.1007/s10955-018-2200-0,
author = {Durán-Olivencia, MA and Gvalani, RS and Kalliadasis, S and Pavliotis, GA},
doi = {10.1007/s10955-018-2200-0},
journal = {Journal of Statistical Physics},
pages = {579--604},
title = {Instability, rupture and fluctuations in thin liquid films: Theory and computations},
url = {http://dx.doi.org/10.1007/s10955-018-2200-0},
volume = {174},
year = {2019}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - Thin liquid films are ubiquitous in natural phenomena and technological applications. They have been extensively studied via deterministic hydrodynamic equations, but thermal fluctuations often play a crucial role that needs to be understood. An example of this is dewetting, which involves the rupture of a thin liquid film and the formation of droplets. Such a process is thermally activated and requires fluctuations to be taken into account self-consistently. In this work we present an analytical and numerical study of a stochastic thin-film equation derived from first principles. Following a brief review of the derivation, we scrutinise the behaviour of the equation in the limit of perfectly correlated noise along the wall-normal direction, as opposed to the perfectly uncorrelated limit studied by Grün et al. (J Stat Phys 122(6):1261–1291, 2006). We also present a numerical scheme based on a spectral collocation method, which is then utilised to simulate the stochastic thin-film equation. This scheme seems to be very convenient for numerical studies of the stochastic thin-film equation, since it makes it easier to select the frequency modes of the noise (following the spirit of the long-wave approximation). With our numerical scheme we explore the fluctuating dynamics of the thin film and the behaviour of its free energy in the vicinity of rupture. Finally, we study the effect of the noise intensity on the rupture time, using a large number of sample paths as compared to previous studies.
AU - Durán-Olivencia,MA
AU - Gvalani,RS
AU - Kalliadasis,S
AU - Pavliotis,GA
DO - 10.1007/s10955-018-2200-0
EP - 604
PY - 2019///
SN - 0022-4715
SP - 579
TI - Instability, rupture and fluctuations in thin liquid films: Theory and computations
T2 - Journal of Statistical Physics
UR - http://dx.doi.org/10.1007/s10955-018-2200-0
UR - http://hdl.handle.net/10044/1/66627
VL - 174
ER -