Imperial College London
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Professor Martyn A McLachlan

Faculty of Engineering, Department of Materials

Professor of Thin Films, Interfaces and Electronic Devices
 
 
 
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Contact

 

+44 (0)20 7594 9692martyn.mclachlan Website

 
 
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Location

 

401 HMolecular Sciences Research HubWhite City Campus

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Summary

 

Publications

Citation

BibTex format

@article{Du:2018:10.1002/adfm.201803943,
author = {Du, T and Burgess, C and Lin, C-T and Eisner, F and Kim, J and Xu, S and Kang, H and Durrant, J and McLachlan, M},
doi = {10.1002/adfm.201803943},
journal = {Advanced Functional Materials},
title = {Probing and controlling intra-grain crystallinity for improved low-temperature processed perovskite solar cells},
url = {http://dx.doi.org/10.1002/adfm.201803943},
volume = {28},
year = {2018}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Here, previously unobserved nanoscale defects residing within individual grains of solutionprocessed methylammonium lead triiodide (CH3NH3PbI3, MAPI) thin films are identified. Using scanning transmission electron microscopy (STEM), the defects inherently associated with the established solutionprocessing methodology are identified, and a facile processing modification to eliminate these defects is introduced. Specifically, defect elimination is achieved by coannealing the asdeposited MAPI layer with the electron transport layer (phenylC61butyric acid methyl, PCBM) resulting in devices that significantly outperform devices prepared using the established methodology—with power conversion efficiencies increasing from 13.6% to 17.4%. The use of transmission electron microscopy allows the correlation of performance enhancements to improved intragrain crystallinity and shows that highly coherent crystallographic orientation results within individual grains when processing is modified. Detailed optoelectronic characterization reveals that the improved intragrain crystallinity drives an improvement of charge collection and a reduction of PEDOT:PSS/perovskite interfacial recombination. The study suggests that the microstructural defects in MAPI, owing to a lack of structural coherence throughout the thickness of thin film, are a significant cause of interfacial recombination.
AU  - Du,T
AU  - Burgess,C
AU  - Lin,C-T
AU  - Eisner,F
AU  - Kim,J
AU  - Xu,S
AU  - Kang,H
AU  - Durrant,J
AU  - McLachlan,M
DO  - 10.1002/adfm.201803943
PY  - 2018///
SN  - 1616-301X
TI  - Probing and controlling intra-grain crystallinity for improved low-temperature processed perovskite solar cells
T2  - Advanced Functional Materials
UR  - http://dx.doi.org/10.1002/adfm.201803943
UR  - http://hdl.handle.net/10044/1/65195
VL  - 28
ER  -
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