Publications
131 results found
Sheppard CJR, Torok P, 1996, Confocal imaging through a dielectric interface: Aberration modeling, Conference on Three-Dimensional Microscopy - Image Acquisition and Processing III, Publisher: SPIE - INT SOC OPTICAL ENGINEERING, Pages: 280-286
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- Citations: 1
Sheppard CJR, Torok P, 1996, Electromagnetic diffraction in high aperture optical systems, 17th Congress of the International-Commission-for-Optics - Optics for Science and New Technology, Publisher: SPIE - INT SOC OPTICAL ENGINEERING, Pages: 31-32
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- Citations: 1
TOROK P, VARGA P, NEMETH G, 1995, ANALYTICAL SOLUTION OF THE DIFFRACTION INTEGRALS AND INTERPRETATION OF WAVE-FRONT DISTORTION WHEN LIGHT IS FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 12, Pages: 2660-2671, ISSN: 0740-3232
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- Citations: 81
TOROK P, VARGA P, BOOKER GR, 1995, ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - STRUCTURE OF THE ELECTROMAGNETIC-FIELD .1., JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 12, Pages: 2136-2144, ISSN: 0740-3232
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- Citations: 133
TOROK P, VARGA P, LACZIK Z, et al., 1995, ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION (VOL 12, PG 325, 1995), JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 12, Pages: 1605-1605, ISSN: 0740-3232
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- Citations: 14
TOROK P, VARGA P, LACZIK Z, et al., 1995, ELECTROMAGNETIC DIFFRACTION OF LIGHT FOCUSED THROUGH A PLANAR INTERFACE BETWEEN MATERIALS OF MISMATCHED REFRACTIVE-INDEXES - AN INTEGRAL-REPRESENTATION, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 12, Pages: 325-332, ISSN: 0740-3232
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- Citations: 350
Booker GR, Laczik Z, Torok P, 1995, Applications of scanning infra-red microscopy to bulk semiconductors, Institute-of-Physics Conference on Microscopy of Semiconducting Materials 1995, Publisher: IOP PUBLISHING LTD, Pages: 681-692, ISSN: 0951-3248
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- Citations: 5
Torok P, Pecz B, Laczik Z, et al., 1995, Imaging of oxide particles in Czochralski silicon wafers using high-performance reflection confocal scanning infra-red microscopy and transmission electron microscopy, Institute-of-Physics Conference on Microscopy of Semiconducting Materials 1995, Publisher: IOP PUBLISHING LTD, Pages: 771-774, ISSN: 0951-3248
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- Citations: 1
Laczik Z, Torok P, Booker GR, 1995, The effect of spherical aberration and surface reflection on the scanning infra-red microscope imaging of oxide particles in Si, Institute-of-Physics Conference on Microscopy of Semiconducting Materials 1995, Publisher: IOP PUBLISHING LTD, Pages: 767-770, ISSN: 0951-3248
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- Citations: 2
TOROK P, BOOKER GR, LACZIK Z, et al., 1993, A NEW CONFOCAL SIRM INCORPORATING REFLECTION, TRANSMISSION AND DOUBLE-PASS MODES EITHER WITH OR WITHOUT DIFFERENTIAL PHASE-CONTRAST IMAGING, 8th Royal-Microscopical-Society Conference: Microscopy of Semiconducting Materials 1993 (MSM VIII), Publisher: IOP PUBLISHING LTD, Pages: 771-774, ISSN: 0951-3248
FALSTER R, LACZIK Z, BOOKER GR, et al., 1992, GETTERING AND GETTERING STABILITY OF METALS AT OXIDE PARTICLES IN SILICON, SYMP ON DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, AT THE 1992 SPRING MEETING OF THE MATERIALS RESEARCH SOC, Publisher: MATERIALS RESEARCH SOC, Pages: 945-956
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- Citations: 16
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