Imperial College London
Portrait Picture

Dr Steph Pendlebury

Faculty of Engineering

IMSE Institute Manager
 
 
 
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Contact

 

+44 (0)20 7594 0901s.pendlebury Website

 
 
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Location

 

Level 2 Office, Central LibraryAbdus Salam LibrarySouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Pendlebury:2014:10.1021/ja504473e,
author = {Pendlebury, SR and Wang, X and Le, Formal F and Cornuz, M and Kafizas, A and Tilley, SD and Graetzel, M and Durrant, JR},
doi = {10.1021/ja504473e},
journal = {Journal of the American Chemical Society},
pages = {9854--9857},
title = {Ultrafast charge carrier recombination and trapping in hematite photoanodes under applied bias},
url = {http://dx.doi.org/10.1021/ja504473e},
volume = {136},
year = {2014}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Transient absorption spectroscopy on subpicosecond to second time scales is used to investigate photogenerated charge carrier recombination in Si-doped nanostructured hematite (α-Fe2O3) photoanodes as a function of applied bias. For unbiased hematite, this recombination exhibits a 50% decay time of ∼6 ps, ∼103 times faster than that of TiO2 under comparable conditions. Anodic bias significantly retards hematite recombination dynamics, and causes the appearance of electron trapping on ps−μs time scales. These ultrafast recombination dynamics, their retardation by applied bias, and the associated electron trapping are discussed in terms of their implications for efficient water oxidation.
AU  - Pendlebury,SR
AU  - Wang,X
AU  - Le,Formal F
AU  - Cornuz,M
AU  - Kafizas,A
AU  - Tilley,SD
AU  - Graetzel,M
AU  - Durrant,JR
DO  - 10.1021/ja504473e
EP  - 9857
PY  - 2014///
SN  - 0002-7863
SP  - 9854
TI  - Ultrafast charge carrier recombination and trapping in hematite photoanodes under applied bias
T2  - Journal of the American Chemical Society
UR  - http://dx.doi.org/10.1021/ja504473e
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000339228200015&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - https://pubs.acs.org/doi/10.1021/ja504473e
VL  - 136
ER  -
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