Imperial College London


Faculty of EngineeringDepartment of Bioengineering

Professor of Neurotechnology



+44 (0)20 7594 1533s.schultz Website




4.11Royal School of MinesSouth Kensington Campus






BibTex format

author = {Schultz, SR and Copeland, CS and Foust, AJ and Quicke, P and Schuck, R},
doi = {10.1109/JPROC.2016.2577380},
journal = {Proceedings of the IEEE},
pages = {139--157},
title = {Advances in two-photon scanning and scanless microscopy technologies for functional neural circuit imaging},
url = {},
volume = {105},
year = {2016}

RIS format (EndNote, RefMan)

AB - Recent years have seen substantial developments in technology for imaging neural circuits, raising the prospect of large-scale imaging studies of neural populations involved in information processing, with the potential to lead to step changes in our understanding of brain function and dysfunction. In this paper, we will review some key recent advances: improved fluorophores for single-cell resolution functional neuroimaging using a two-photon microscope; improved approaches to the problem of scanning active circuits; and the prospect of scanless microscopes which overcome some of the bandwidth limitations of current imaging techniques. These advances in technology for experimental neuroscience have in themselves led to technical challenges, such as the need for the development of novel signal processing and data analysis tools in order to make the most of the new experimental tools. We review recent work in some active topics, such as region of interest segmentation algorithms capable of demixing overlapping signals, and new highly accurate algorithms for calcium transient detection. These advances motivate the development of new data analysis tools capable of dealing with spatial or spatiotemporal patterns of neural activity that scale well with pattern size.
AU - Schultz,SR
AU - Copeland,CS
AU - Foust,AJ
AU - Quicke,P
AU - Schuck,R
DO - 10.1109/JPROC.2016.2577380
EP - 157
PY - 2016///
SN - 0018-9219
SP - 139
TI - Advances in two-photon scanning and scanless microscopy technologies for functional neural circuit imaging
T2 - Proceedings of the IEEE
UR -
UR -
VL - 105
ER -