Imperial College London
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Professor Stephen Skinner

Faculty of Engineering, Department of Materials

CeresPower/RAEng Research Chair in Electrochemical Devices
 
 
 
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Contact

 

+44 (0)20 7594 6782s.skinner

 
 
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Location

 

206GoldsmithSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Kilner:2011:10.1007/s10008-010-1289-0,
author = {Kilner, JA and Skinner, SJ and Brongersma, HH},
doi = {10.1007/s10008-010-1289-0},
journal = {JOURNAL OF SOLID STATE ELECTROCHEMISTRY},
pages = {861--876},
title = {The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS},
url = {http://dx.doi.org/10.1007/s10008-010-1289-0},
volume = {15},
year = {2011}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Kilner,JA
AU  - Skinner,SJ
AU  - Brongersma,HH
DO  - 10.1007/s10008-010-1289-0
EP  - 876
PY  - 2011///
SN  - 1432-8488
SP  - 861
TI  - The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS
T2  - JOURNAL OF SOLID STATE ELECTROCHEMISTRY
UR  - http://dx.doi.org/10.1007/s10008-010-1289-0
UR  - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000290040500002&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
UR  - http://hdl.handle.net/10044/1/12708
VL  - 15
ER  -
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