AFM and TERS

NTMDT NTEGRA Spectra AFM/Raman system

Our AFM/Raman system with upright and inverted microscope enable the phenomenon of tip-enhanced Raman to be exploited for a variety of samples, with laser illumination from the top or underside of the sample.  The presence of the AFM tip near the sample surface within the beam of Raman laser gives an enhanced Raman signal from the tip, giving a spatial resolution well below the diffraction limit of the laser.

 

The NTEGRA Spectra AFM-Raman system contains a 473 nm 100mW laser, and a 633 nm 50mW laser for acquiring Raman spectra with a microscope that can be used in upright or inverted modes.