@article{Dong:2020:1882-0786/ab88c7,
author = {Dong, X and Yetisen, AK and Tian, H and Dong, J and Koehler, MH and Jakobi, M and Koch, AW},
doi = {1882-0786/ab88c7},
journal = {Applied Physics Express},
title = {Analyses of hyperspectral imaging microscopy data sets of semiconducting 2D materials},
url = {http://dx.doi.org/10.35848/1882-0786/ab88c7},
volume = {13},
year = {2020}
}

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TY  - JOUR
AB  - The unique optical properties of two-dimensional (2D) materials are largely dependent on the number of atomic layers. Hyperspectral imaging microscopy shows large potential for rapid and accurate thickness mapping. To process the acquired hyperspectral data set and to deal with pixel-level spectra remain a challenge for further application. In this work, two quantitative classification strategies including linear unmixing and spectral peak mapping were conducted to characterize a multilayer semiconducting MoS2 flake with nanoscale thickness variations. The comparative study paves the way to identify 2D semiconducting materials with random layer numbers (monolayer, bilayer, and few-layer) in both laboratory and industry.
AU  - Dong,X
AU  - Yetisen,AK
AU  - Tian,H
AU  - Dong,J
AU  - Koehler,MH
AU  - Jakobi,M
AU  - Koch,AW
DO  - 1882-0786/ab88c7
PY  - 2020///
SN  - 1882-0778
TI  - Analyses of hyperspectral imaging microscopy data sets of semiconducting 2D materials
T2  - Applied Physics Express
UR  - http://dx.doi.org/10.35848/1882-0786/ab88c7
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000529895600001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - https://iopscience.iop.org/article/10.35848/1882-0786/ab88c7
VL  - 13
ER  - 

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