SPEAKER: Professor John O’Connor, University of Newcastle School of Mathematical & Physical Sciences, University of Newcastle, UK
ABSTRACT:
Low Energy Ion Scattering has a well demonstrated capability of providing surface atomic layer composition analysis and near surface analysis for a broad range of materials.
Its particular surface atomic layer composition sensitivity is unmatched by any other surface analysis technique however it does have the capability of achieving much more if the processes of recoil detection, double scattering, shadow cones, negative ion detection and quantum interference are included as supplementary techniques.
This presentation will review applications where each of these processes were used to directly extract surface layer composition and structure information