Citation

BibTex format

@article{Liang:2019:10.1016/j.ultramic.2018.11.011,
author = {Liang, XZ and Dodge, MF and Jiang, J and Dong, HB},
doi = {10.1016/j.ultramic.2018.11.011},
journal = {Ultramicroscopy},
pages = {39--45},
title = {Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale},
url = {http://dx.doi.org/10.1016/j.ultramic.2018.11.011},
volume = {197},
year = {2019}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - It is challenging to quantify the geometrically necessary dislocation (GND) density at the nanoscale using conventional electron backscatter diffraction due to its limited spatial resolution. To overcome this problem, in this study, the transmission Kikuchi diffraction (TKD) technique is used to measure lattice orientation and to calculate the corresponding nanoscale GND density. Using the TKD method, a variation of GND density from 6×1014 to 1016 m−2 has been measured in a welded super duplex stainless steel sample. The distribution of dislocation density is shown to be in good agreement with transmission electron microscope (TEM) result. Compared with dislocation measurements obtained by TEM, the TKD–GND method is revealed to be a relatively accurate, fast and accessible method.
AU - Liang,XZ
AU - Dodge,MF
AU - Jiang,J
AU - Dong,HB
DO - 10.1016/j.ultramic.2018.11.011
EP - 45
PY - 2019///
SN - 0304-3991
SP - 39
TI - Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale
T2 - Ultramicroscopy
UR - http://dx.doi.org/10.1016/j.ultramic.2018.11.011
UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000456311700006&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR - https://www.sciencedirect.com/science/article/pii/S0304399118300883?via%3Dihub
VL - 197
ER -