Zeiss Gemini Sigma300
The Zeiss Gemini Sigma300 FEG SEM system is a new addition to the electron microscopy suite in Department of Materials. Is has been specifically purchased for the examination of nanoparticles in in secondary electron (SE) and backscattered (BS) imaging conditions.
The High Definition Backscatter Detector (HD BSD) in this FEG SEM allows the researcher to examine samples contain-ing nanoparticles of different phases, dislocation distributions, and very fine grain-size structure.
- Accelerating Voltage: 0.02 – 30 kV
- Resolution @ 15 kV: 1.2 nm
- Resolution @ 1 kV 2.2 nm
Zeiss Gemini Sigma300 help and support
Dr Mahmoud Ardakani
Personal detailsDr Mahmoud Ardakani Research Officer, Harvey Flowers Electron Microscopy Suite
Send email+44 (0)20 7594 6739
Department of Materials
Royal School of Mines
Lower Ground Floor, LG05