The F20–UV is a thin film analyser with the ability to measure thickness and refractive index in less than a second. Like all thickness measurement instruments, it connects to the USB port of the computer and is set-up in minutes.

The thickness measurement ranges between 1 nm – 40 μm, with a wavelength range between 190 – 1100 nm.

Features included in the F20–UV include an integrated spectrometer, a flattening filter for highly reflective sub-strates, a FILmeasure standalone software for remote data analysis, reflectance standards, thickness standard, SS-3 sample stage with fibre optic cable and a TH1-lamp.

Filmetric F20-UV Thin Film Analyser
Filmetric F20-UV Thin Film Analyser

Filmetric F20-UV thin film analyser help and support

  • Dr Peter Petrov

    Dr Peter Petrov, Department of Materials, Imperial College London

    Personal details

    Dr Peter Petrov Principal Research Scientist Thin Film Laboratory

    +44 (0)20 7594 8156

    Support with

    General enquiries, users registrations and academic research in Thin Film Technology


    Department of Materials
    Bessemer Building (though the TYC/ LCN corridor)
    Ground Floor, B333