The Microwave (MW) Cryo-probe Station is designed to provide affordable vacuum and cryogenic probing of wafers and devices.
The on-wafer measurements could be performed under external electrical bias and magnetic field (up to 0.15 T) applied in horizontal or vertical directions, in a wide temperature (10 K – 600 K) and frequency (d.c. – 40 GHz) ranges.

The system can be used in a wide variety of fields, including superconductivity, MEMS, ferroelec-trics, nanoscale electronics, material sciences, and optics.

Janis Microwave Cryo Probe Station
Janis Microwave Cryo Probe Station

Janis images

Janis Microwave Cryo Probe Station help and support

  • Dr Peter Petrov

    Dr Peter Petrov, Department of Materials, Imperial College London

    Personal details

    Dr Peter Petrov Principal Research Scientist Thin Film Laboratory

    +44 (0)20 7594 8156

    Support with

    General enquiries, users registrations and academic research in Thin Film Technology


    Department of Materials
    Bessemer Building (though the TYC/ LCN corridor)
    Ground Floor, B333