Citation

BibTex format

@article{Lee:2018:10.1002/advs.201801350,
author = {Lee, S and Kim, DB and Hamilton, I and Daboczi, M and Nam, YS and Lee, BR and Zhao, B and Jang, CH and Friend, RH and Kim, J-S and Song, MH},
doi = {10.1002/advs.201801350},
journal = {Advanced Science},
title = {Control of interface defects for efficient and stable quasi-2D Perovskite light-emitting diodes using nickel oxide hole injection layer},
url = {http://dx.doi.org/10.1002/advs.201801350},
volume = {5},
year = {2018}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - Metal halide perovskites (MHPs) have emerged as promising materials for lightemitting diodes owing to their narrow emission spectrum and wide range of color tunability. However, the low exciton binding energy in MHPs leads to a competition between the trapmediated nonradiative recombination and the bimolecular radiative recombination. Here, efficient and stable green emissive perovskite lightemitting diodes (PeLEDs) with an external quantum efficiency of 14.6% are demonstrated through compositional, dimensional, and interfacial modulations of MHPs. The interfacial energetics and optoelectronic properties of the perovskite layer grown on a nickel oxide (NiOx) and poly(3,4ethylenedioxythiophene):polystyrene sulfonate hole injection interfaces are investigated. The better interface formed between the NiOx/perovskite layers in terms of lower density of traps/defects, as well as more balanced charge carriers in the perovskite layer leading to high recombination yield of carriers are the main reasons for significantly improved device efficiency, photostability of perovskite, and operational stability of PeLEDs.
AU - Lee,S
AU - Kim,DB
AU - Hamilton,I
AU - Daboczi,M
AU - Nam,YS
AU - Lee,BR
AU - Zhao,B
AU - Jang,CH
AU - Friend,RH
AU - Kim,J-S
AU - Song,MH
DO - 10.1002/advs.201801350
PY - 2018///
SN - 2198-3844
TI - Control of interface defects for efficient and stable quasi-2D Perovskite light-emitting diodes using nickel oxide hole injection layer
T2 - Advanced Science
UR - http://dx.doi.org/10.1002/advs.201801350
UR - http://hdl.handle.net/10044/1/64766
VL - 5
ER -