2016 CANDO 4-Wire Interface + Test Circuits (CBIT16E01_CANDO5)
Test circuits for CANDO optrode including 4-wire communication sub-system, non-volatile memory, and test structures for long-term reliability testing.
- Related projects: CANDO
Technology: AMS 0.35μm 2P4M CMOS (H35B4S1)
Silicon Area: 4mm × 3.75mm
Designers: Dorian Haci, Federico Mazza, Sara S. Ghoreishizadeh, Yan Liu, Timothy G. Constandinou
Tape-out: May 2016
- S. S. Ghoreishizadeh, D. Haci, Y. Liu, N. Donaldson and T. G. Constandinou, "Four-Wire Interface ASIC for a Multi-Implant Link," in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 64, no. 12, pp. 3056-3067, Dec. 2017.
- A. Mifsud, D. Haci, S. S. Ghoreishizadeh, Y. Liu and T. G. Constandinou, "Adaptive power regulation and data delivery for multi-module implants," 2017 IEEE Biomedical Circuits and Systems Conference (BioCAS), Turin, 2017, pp. 1-4.