Publications
28 results found
Cooper D, Truche R, Twitchett-Harrison AC, et al., 2009, Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling, JOURNAL OF MICROSCOPY, Vol: 233, Pages: 102-113, ISSN: 0022-2720
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- Citations: 24
Twitchett-Harrison AC, Yates TJV, Dunin-Borkowski RE, et al., 2008, Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures, ULTRAMICROSCOPY, Vol: 108, Pages: 1401-1407, ISSN: 0304-3991
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- Citations: 33
Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley P-A, 2008, Mapping the electrical properties of semiconductor junctions - the electron holographic approach, SCANNING, Vol: 30, Pages: 299-309, ISSN: 0161-0457
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- Citations: 8
Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PA, 2008, 3-D Characterisation of the Electrostatic Potential in an Electrically Biased Silicon Device, 15th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 379-382, ISSN: 0930-8989
Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PA, 2008, Critical Thickness for Semiconductor Specimens Prepared using Focused Ion Beam Milling, 15th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 445-448, ISSN: 0930-8989
Twitchett-Harrison AC, Yates TJV, Newcomb SB, et al., 2007, High-resolution three-dimensional mapping of semiconductor dopant potentials, NANO LETTERS, Vol: 7, Pages: 2020-2023, ISSN: 1530-6984
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- Citations: 52
Cooper D, Twitchett-Harrison AC, Midgley PA, et al., 2007, The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions, JOURNAL OF APPLIED PHYSICS, Vol: 101, ISSN: 0021-8979
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- Citations: 29
Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2006, Comparison of off-axis and in-line electron holography as quantitative dopant-profiling techniques, PHILOSOPHICAL MAGAZINE, Vol: 86, Pages: 5805-5823, ISSN: 1478-6435
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- Citations: 14
Kazemian P, Twitchett AC, Humphreys CJ, et al., 2006, Site-specific dopant profiling in a scanning electron microscope using focused ion beam prepared specimens, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951
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- Citations: 19
Cooper D, Twitchett AC, Somodi PK, et al., 2006, Improvement in electron holographic phase images of focused-ion-beam-milled GaAs and Si p-n junctions by in situ annealing, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951
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- Citations: 56
Twitchett AC, Yates TJV, Dunin-Borkowski RE, et al., 2006, Three-dimensional electrostatic-potential of a Si p-n junction revealed using tomographic electron holography, EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale, Publisher: IOP PUBLISHING LTD, Pages: 29-+, ISSN: 1742-6588
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- Citations: 8
Twitchett AC, Dunin-Borkowski RE, Hallifax RJ, et al., 2005, Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions, MICROSCOPY AND MICROANALYSIS, Vol: 11, Pages: 66-78, ISSN: 1431-9276
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- Citations: 29
Twitchett AC, Yates TJV, Somodi PK, et al., 2005, Three-dimensional analysis of the dopant potential of a silicon p-n junction by holographic tomography, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 229-232, ISSN: 0930-8989
Dunin-Borkowski RE, Twitchett AC, Midgley PA, et al., 2005, Electron holography of doped semiconductors: when does it work and is it quantitative?, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 203-212, ISSN: 0930-8989
Somodi PK, Dunin-Borkowski RE, Twitchett AC, et al., 2005, Simulations of the electrostatic potential in a thin silicon specimen containing a p-n junction, Symposium on Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure held at the 2004 MRS Fall Meeting, Publisher: MATERIALS RESEARCH SOCIETY, Pages: 37-42, ISSN: 0272-9172
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- Citations: 1
Cooper D, Twitchett AC, Farrer I, et al., 2005, Off-axis electron holography of focused ion beam milled GaAs and Si p-n junctions, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 221-224, ISSN: 0930-8989
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- Citations: 1
Somodi PK, Dunin-Borkowski RE, Twitchett AC, et al., 2005, Towards quantitative electron holography of electrostatic potentials in doped semiconductors, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 225-228, ISSN: 0930-8989
Twitchett AC, Dunin-Borkowski RE, Hallifax RJ, et al., 2004, Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices, JOURNAL OF MICROSCOPY, Vol: 214, Pages: 287-296, ISSN: 0022-2720
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- Citations: 36
Twitchett AC, Dunin-Borkowski RE, Broom RF, et al., 2004, Quantitative electron holography of biased semiconductor devices, 7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Publisher: IOP PUBLISHING LTD, Pages: S181-S192, ISSN: 0953-8984
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- Citations: 20
Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2004, The effects of sample preparation on electron holography of semiconductor devices, Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), Publisher: IOP PUBLISHING LTD, Pages: 367-370, ISSN: 0951-3248
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- Citations: 1
Zhi D, Wei M, Pashley DW, et al., 2004, The structure of uncapped, buried and multiple stacked Ge/Si quantum dots, Bristol, Institute of Physics Electron Microscopy and Analysis group conference (EMAG 2003), Oxford, England, 3 - 5 September 2003, Publisher: IOP Publishing Ltd, Pages: 39-42
Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2003, Electron holography of biased semiconductor devices, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 497-500, ISSN: 0951-3248
Cooper D, Twitchett AC, Dunin-Borkowski RE, et al., 2003, The application of advanced TEM techniques to the characterisation of an asymmetric spacer layer tunnel diode, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 53-56, ISSN: 0951-3248
Somodi PK, Dunin-Borkowski RE, Twitchett AC, et al., 2003, Simulations of the electrostatic potential distribution in a TEM sample of a semiconductor device, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 501-504, ISSN: 0951-3248
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- Citations: 6
Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2002, Quantitative electron holography of biased semiconductor devices, PHYSICAL REVIEW LETTERS, Vol: 88, ISSN: 0031-9007
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- Citations: 134
Twitchett AC, Midgley PA, 2001, Mapping of 2-D dopant distribution using electron holography, Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 29-32, ISSN: 0951-3248
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- Citations: 2
Twitchett AC, Hallifax RJ, Broom RF, et al., 2001, Electron holography of biased semiconductor junctions, Conference of the Electron-Microscopy-and Analysis-Group, Publisher: IOP PUBLISHING LTD, Pages: 493-496, ISSN: 0951-3248
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- Citations: 1
Lloyd SJ, Twitchett AC, Blamire MG, et al., 1999, Magnetic contrast in a focused ion beam microscope, Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99), Publisher: IOP PUBLISHING LTD, Pages: 99-102, ISSN: 0951-3248
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- Citations: 4
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