Imperial College London
Dr Alison Harrison

DrAlisonHarrison

Faculty of Engineering, Department of Materials

Honorary Lecturer
 
 
 
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Contact

 

+44 (0)20 7594 9693a.harrison

 
 
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Location

 

B323Bessemer BuildingSouth Kensington Campus

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Summary

 

Publications

Publication Type
Year
to

28 results found

Cooper D, Truche R, Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PAet al., 2009, Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam milling, JOURNAL OF MICROSCOPY, Vol: 233, Pages: 102-113, ISSN: 0022-2720

Journal article

Twitchett-Harrison AC, Yates TJV, Dunin-Borkowski RE, Midgley PAet al., 2008, Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures, ULTRAMICROSCOPY, Vol: 108, Pages: 1401-1407, ISSN: 0304-3991

Journal article

Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley P-A, 2008, Mapping the electrical properties of semiconductor junctions - the electron holographic approach, SCANNING, Vol: 30, Pages: 299-309, ISSN: 0161-0457

Journal article

Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PA, 2008, 3-D Characterisation of the Electrostatic Potential in an Electrically Biased Silicon Device, 15th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 379-382, ISSN: 0930-8989

Conference paper

Twitchett-Harrison AC, Dunin-Borkowski RE, Midgley PA, 2008, Critical Thickness for Semiconductor Specimens Prepared using Focused Ion Beam Milling, 15th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 445-448, ISSN: 0930-8989

Conference paper

Twitchett-Harrison AC, Yates TJV, Newcomb SB, Dunin-Borkowski RE, Midgley PAet al., 2007, High-resolution three-dimensional mapping of semiconductor dopant potentials, NANO LETTERS, Vol: 7, Pages: 2020-2023, ISSN: 1530-6984

Journal article

Cooper D, Twitchett-Harrison AC, Midgley PA, Dunin-Borkowski REet al., 2007, The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions, JOURNAL OF APPLIED PHYSICS, Vol: 101, ISSN: 0021-8979

Journal article

Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2006, Comparison of off-axis and in-line electron holography as quantitative dopant-profiling techniques, PHILOSOPHICAL MAGAZINE, Vol: 86, Pages: 5805-5823, ISSN: 1478-6435

Journal article

Kazemian P, Twitchett AC, Humphreys CJ, Rodenburg Cet al., 2006, Site-specific dopant profiling in a scanning electron microscope using focused ion beam prepared specimens, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951

Journal article

Cooper D, Twitchett AC, Somodi PK, Midgley PA, Dunin-Borkowski RE, Farrer I, Ritchie DAet al., 2006, Improvement in electron holographic phase images of focused-ion-beam-milled GaAs and Si p-n junctions by in situ annealing, APPLIED PHYSICS LETTERS, Vol: 88, ISSN: 0003-6951

Journal article

Twitchett AC, Yates TJV, Dunin-Borkowski RE, Newcomb SB, Midgley PAet al., 2006, Three-dimensional electrostatic-potential of a Si p-n junction revealed using tomographic electron holography, EMAG/NANO Conference on Imaging, Analysis and Fabrication on the Nanoscale, Publisher: IOP PUBLISHING LTD, Pages: 29-+, ISSN: 1742-6588

Conference paper

Twitchett AC, Dunin-Borkowski RE, Hallifax RJ, Broom RF, Midgley PAet al., 2005, Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions, MICROSCOPY AND MICROANALYSIS, Vol: 11, Pages: 66-78, ISSN: 1431-9276

Journal article

Twitchett AC, Yates TJV, Somodi PK, Newcomb SB, Dunin-Borkowski RE, Midgley PAet al., 2005, Three-dimensional analysis of the dopant potential of a silicon p-n junction by holographic tomography, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 229-232, ISSN: 0930-8989

Conference paper

Dunin-Borkowski RE, Twitchett AC, Midgley PA, McCartney MR, Kasama T, Cooper D, Somodi PKet al., 2005, Electron holography of doped semiconductors: when does it work and is it quantitative?, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 203-212, ISSN: 0930-8989

Conference paper

Somodi PK, Dunin-Borkowski RE, Twitchett AC, Barnes CHW, Midgley PAet al., 2005, Simulations of the electrostatic potential in a thin silicon specimen containing a p-n junction, Symposium on Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure held at the 2004 MRS Fall Meeting, Publisher: MATERIALS RESEARCH SOCIETY, Pages: 37-42, ISSN: 0272-9172

Conference paper

Cooper D, Twitchett AC, Farrer I, Ritchie DA, Dunin-Borkowski RE, Midgley PAet al., 2005, Off-axis electron holography of focused ion beam milled GaAs and Si p-n junctions, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 221-224, ISSN: 0930-8989

Conference paper

Somodi PK, Dunin-Borkowski RE, Twitchett AC, Barnes CHW, Midgley PAet al., 2005, Towards quantitative electron holography of electrostatic potentials in doped semiconductors, 14th Conference on Microscopy of Semiconducting Materials, Publisher: SPRINGER-VERLAG BERLIN, Pages: 225-228, ISSN: 0930-8989

Conference paper

Twitchett AC, Dunin-Borkowski RE, Hallifax RJ, Broom RF, Midgley PAet al., 2004, Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices, JOURNAL OF MICROSCOPY, Vol: 214, Pages: 287-296, ISSN: 0022-2720

Journal article

Twitchett AC, Dunin-Borkowski RE, Broom RF, Midgley PAet al., 2004, Quantitative electron holography of biased semiconductor devices, 7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, Publisher: IOP PUBLISHING LTD, Pages: S181-S192, ISSN: 0953-8984

Conference paper

Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2004, The effects of sample preparation on electron holography of semiconductor devices, Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003), Publisher: IOP PUBLISHING LTD, Pages: 367-370, ISSN: 0951-3248

Conference paper

Zhi D, Wei M, Pashley DW, Joyce BA, Weyland M, Laffont L, Yates TJV, Twitchett AC, Dunin-Borkowski RE, Midgley PAet al., 2004, The structure of uncapped, buried and multiple stacked Ge/Si quantum dots, Bristol, Institute of Physics Electron Microscopy and Analysis group conference (EMAG 2003), Oxford, England, 3 - 5 September 2003, Publisher: IOP Publishing Ltd, Pages: 39-42

Conference paper

Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2003, Electron holography of biased semiconductor devices, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 497-500, ISSN: 0951-3248

Conference paper

Cooper D, Twitchett AC, Dunin-Borkowski RE, Zhi D, Kelly MJ, Midgley PAet al., 2003, The application of advanced TEM techniques to the characterisation of an asymmetric spacer layer tunnel diode, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 53-56, ISSN: 0951-3248

Conference paper

Somodi PK, Dunin-Borkowski RE, Twitchett AC, Barnes CHW, Midgley PAet al., 2003, Simulations of the electrostatic potential distribution in a TEM sample of a semiconductor device, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 501-504, ISSN: 0951-3248

Conference paper

Twitchett AC, Dunin-Borkowski RE, Midgley PA, 2002, Quantitative electron holography of biased semiconductor devices, PHYSICAL REVIEW LETTERS, Vol: 88, ISSN: 0031-9007

Journal article

Twitchett AC, Midgley PA, 2001, Mapping of 2-D dopant distribution using electron holography, Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 29-32, ISSN: 0951-3248

Conference paper

Twitchett AC, Hallifax RJ, Broom RF, Lloyd SJ, Midgley PAet al., 2001, Electron holography of biased semiconductor junctions, Conference of the Electron-Microscopy-and Analysis-Group, Publisher: IOP PUBLISHING LTD, Pages: 493-496, ISSN: 0951-3248

Conference paper

Lloyd SJ, Twitchett AC, Blamire MG, Midgley PAet al., 1999, Magnetic contrast in a focused ion beam microscope, Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99), Publisher: IOP PUBLISHING LTD, Pages: 99-102, ISSN: 0951-3248

Conference paper

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