Imperial College London
Professor Alan Atkinson

ProfessorAlanAtkinson

Faculty of Engineering, Department of Materials

Emeritus Professor
 
 
 
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Contact

 

+44 (0)20 7594 6780alan.atkinson

 
 
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Location

 

214Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Chen:2017:10.1149/2.0821709jes,
author = {Chen, J and Bertei, A and Ruiz-Trejo, E and Atkinson, A and Brandon, NP},
doi = {10.1149/2.0821709jes},
journal = {Journal of The Electrochemical Society},
pages = {F935--F943},
title = {Characterization of Degradation in Nickel Impregnated Scandia-Stabilize Zirconia Electrodes during Isothermal Annealing},
url = {http://dx.doi.org/10.1149/2.0821709jes},
volume = {164},
year = {2017}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - This study investigates the stability of nickel-impregnated scandia-stabilize zirconia composite electrodes during isothermal annealing at temperatures from 600 to 950°C in a humidified hydrogen atmosphere (3 vol % water vapor). Typically an initial rapid degradation of the electrode during the first 17 h of annealing is revealed by both an increase in polarization resistance and a fall in electronic conductivity. Secondary electron images show a shift in nickel particle size toward larger values after 50 h of annealing. The declining electrochemical performance is hence attributed to nickel coarsening at elevated temperatures. Nickel coarsening has two microstructural effects: breaking up nickel percolation; and reducing the density of triple phase boundaries. Their impact on electrode area specific resistance is explored using a physical model of electrode performance which relates the macroscopic electrochemical performance to measurable microstructural parameters.
AU  - Chen,J
AU  - Bertei,A
AU  - Ruiz-Trejo,E
AU  - Atkinson,A
AU  - Brandon,NP
DO  - 10.1149/2.0821709jes
EP  - 943
PY  - 2017///
SN  - 1945-7111
SP  - 935
TI  - Characterization of Degradation in Nickel Impregnated Scandia-Stabilize Zirconia Electrodes during Isothermal Annealing
T2  - Journal of The Electrochemical Society
UR  - http://dx.doi.org/10.1149/2.0821709jes
UR  - http://hdl.handle.net/10044/1/53567
VL  - 164
ER  -
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