Imperial College London
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Dr T Ben Britton

Faculty of Engineering, Department of Materials

Visiting Reader
 
 
 
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Contact

 

+44 (0)20 7594 2634b.britton Website

 
 
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Location

 

B301Bessemer BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Gianola:2019:10.1557/mrs.2019.125,
author = {Gianola, DS and Britton, TB and Zaefferer, S},
doi = {10.1557/mrs.2019.125},
journal = {MRS Bulletin},
pages = {450--458},
title = {New techniques for imaging and identifying defects in electron microscopy},
url = {http://dx.doi.org/10.1557/mrs.2019.125},
volume = {44},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Defects in crystalline solids control the properties of engineered and natural materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and their interactions, owing to beneficial spatial resolution and contrast mechanisms that enable direct imaging of defects. These defects reside in complex microstructures and chemical environments, demanding a combination of experimental approaches for full defect characterization. In this article, we describe recent progress and trends in methods for examining defects using scanning electron microscopy platforms. Several emerging approaches offer attractive benefits, for instance, in correlative microscopy across length scales and in in situ studies of defect dynamics.
AU  - Gianola,DS
AU  - Britton,TB
AU  - Zaefferer,S
DO  - 10.1557/mrs.2019.125
EP  - 458
PY  - 2019///
SN  - 0883-7694
SP  - 450
TI  - New techniques for imaging and identifying defects in electron microscopy
T2  - MRS Bulletin
UR  - http://dx.doi.org/10.1557/mrs.2019.125
UR  - http://hdl.handle.net/10044/1/71027
VL  - 44
ER  -
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