Imperial College London
Portrait Picture

Dr T Ben Britton

Faculty of Engineering, Department of Materials

Visiting Reader
 
 
 
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Contact

 

+44 (0)20 7594 2634b.britton Website

 
 
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Location

 

B301Bessemer BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Tong:2021:10.1016/j.ultramic.2020.113130,
author = {Tong, VS and Ben, Britton T},
doi = {10.1016/j.ultramic.2020.113130},
journal = {Ultramicroscopy},
pages = {1--8},
title = {TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps},
url = {http://dx.doi.org/10.1016/j.ultramic.2020.113130},
volume = {221},
year = {2021}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan speed, leading to tilt and drift distortions that obscure or distort features in the final microstructure map. In this paper, we describe TrueEBSD, an automatic postprocessing procedure for distortion correction with pixel-scale precision. Intermediate images are used to separate tilt and drift distortion components and fit each to a physically-informed distortion model. We demonstrate TrueEBSD on three case studies (titanium, zirconium and hydride containing Zr), where distortion removal has enabled characterisation of otherwise inaccessible microstructural features.
AU  - Tong,VS
AU  - Ben,Britton T
DO  - 10.1016/j.ultramic.2020.113130
EP  - 8
PY  - 2021///
SN  - 0304-3991
SP  - 1
TI  - TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps
T2  - Ultramicroscopy
UR  - http://dx.doi.org/10.1016/j.ultramic.2020.113130
UR  - https://www.sciencedirect.com/science/article/pii/S0304399120302801?via%3Dihub
UR  - http://hdl.handle.net/10044/1/85159
VL  - 221
ER  -
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