Imperial College London
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Dr T Ben Britton

Faculty of Engineering, Department of Materials

Visiting Reader
 
 
 
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Contact

 

+44 (0)20 7594 2634b.britton Website

 
 
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Location

 

B301Bessemer BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@unpublished{Fang:2022,
author = {Fang, N and Birch, R and Britton, TB},
publisher = {Elsevier},
title = {Optimizing broad ion beam polishing of zircaloy-4 for electron  backscatter diffraction analysis},
url = {http://arxiv.org/abs/2201.02501v1},
year = {2022}
}
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RIS format (EndNote, RefMan)

TY  - UNPB
AB  - Microstructural analysis with electron backscatter diffraction (EBSD)involves sectioning and polishing to create a flat and preparation-artifactfree surface. The quality of EBSD analysis is often dependant on this step, andthis motivates us to explore how broad ion beam (BIB) milling can be optimisedfor the preparation of zircaloy-4 with different grain sizes. We systematicallyexplore the role of ion beam angle, ion beam voltage, polishing duration andpolishing temperature and how this changes the surface roughness and indexingquality. Our results provide a method to routinely prepare high-qualityZircaloy-4 surfaces, and methods to optimise BIB polishing of other materialsfor high-quality EBSD studies.
AU  - Fang,N
AU  - Birch,R
AU  - Britton,TB
PB  - Elsevier
PY  - 2022///
TI  - Optimizing broad ion beam polishing of zircaloy-4 for electron  backscatter diffraction analysis
UR  - http://arxiv.org/abs/2201.02501v1
UR  - http://hdl.handle.net/10044/1/96358
ER  -
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