Imperial College London
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ProfessorBaptisteGault

Faculty of Engineering, Department of Materials

Professor of Atomic-Scale Characterization
 
 
 
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b.gault

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Publication Type
Year
to

440 results found

Burgess T, Du S, Gault B, Gao Q, Tan HH, Zheng R, Jagadish Cet al., 2012, Quantification of the zinc dopant concentration in GaAs nanowires, Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD), Publisher: IEEE, Pages: 41-+, ISSN: 1097-2137

Conference paper

Gault B, Chen YM, Moody MP, Ohkubo T, Hono K, Ringer SPet al., 2011, Influence of the wavelength on the spatial resolution of pulsed-laser atom probe, JOURNAL OF APPLIED PHYSICS, Vol: 110, ISSN: 0021-8979

Journal article

Gault B, Loi ST, Araullo-Peters VJ, Stephenson LT, Moody MP, Shrestha SL, Marceau RKW, Yao L, Cairney JM, Ringer SPet al., 2011, Dynamic reconstruction for atom probe tomography, Ultramicroscopy, Vol: 111, Pages: 1619-1624, ISSN: 0304-3991

Progress in the reconstruction for atom probe tomography has been limited since the first implementation of the protocol proposed by Bas et al. in 1995. This approach and those subsequently developed assume that the geometric parameters used to build the three-dimensional atom map are constant over the course of an analysis. Here, we test this assumption within the analyses of low-alloyed materials. By building upon methods recently proposed to measure the tomographic reconstruction parameters, we demonstrate that this assumption can introduce significant limitations in the accuracy of the analysis. Moreover, we propose a strategy to alleviate this problem through the implementation of a new reconstruction algorithm that dynamically accommodates variations in the tomographic reconstruction parameters.

Journal article

Stephenson LT, Moody MP, Gault B, Ringer SPet al., 2011, Estimating the Physical Cluster-Size Distribution Within Materials Using Atom-Probe, MICROSCOPY RESEARCH AND TECHNIQUE, Vol: 74, Pages: 799-803, ISSN: 1059-910X

Journal article

Yeoh WK, Gault B, Cui XY, Zhu C, Moody MP, Li L, Zheng RK, Li WX, Wang XL, Dou SX, Sun GL, Lin CT, Ringer SPet al., 2011, Direct Observation of Local Potassium Variation and Its Correlation to Electronic Inhomogeneity in (Ba<sub>1-<i>x</i></sub>K<i><sub>x</sub></i>)Fe<sub>2</sub>As<sub>2</sub> Pnictide, PHYSICAL REVIEW LETTERS, Vol: 106, ISSN: 0031-9007

Journal article

Mueller M, Saxey DW, Smith GDW, Gault Bet al., 2011, Some aspects of the field evaporation behaviour of GaSb, ULTRAMICROSCOPY, Vol: 111, Pages: 487-492, ISSN: 0304-3991

Journal article

Gault B, de Geuser F, Bourgeois L, Gabble BM, Ringer SP, Muddle BCet al., 2011, Atom probe tomography and transmission electron microscopy characterisation of precipitation in an Al-Cu-Li-Mg-Ag alloy, ULTRAMICROSCOPY, Vol: 111, Pages: 683-689, ISSN: 0304-3991

Journal article

Gault B, Haley D, de Geuser F, Moody MP, Marquis BA, Larson DJ, Geiser BPet al., 2011, Advances in the reconstruction of atom probe tomography data, ULTRAMICROSCOPY, Vol: 111, Pages: 448-457, ISSN: 0304-3991

Journal article

Moody MP, Tang F, Gault B, Ringer SP, Cairney JMet al., 2011, Atom probe crystallography: Characterization of grain boundary orientation relationships in nanocrystalline aluminium, ULTRAMICROSCOPY, Vol: 111, Pages: 493-499, ISSN: 0304-3991

Journal article

Hyde JM, Burke MG, Gault B, Saxey DW, Styman P, Wilford KB, Williams TJet al., 2011, Atom probe tomography of reactor pressure vessel steels: An analysis of data integrity, ULTRAMICROSCOPY, Vol: 111, Pages: 676-682, ISSN: 0304-3991

Journal article

Hudson D, Smith GDW, Gault B, 2011, Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys, ULTRAMICROSCOPY, Vol: 111, Pages: 480-486, ISSN: 0304-3991

Journal article

Moody MP, Gault B, Stephenson LT, Marceau RKW, Powles RC, Ceguerra AV, Breen AJ, Ringer SPet al., 2011, Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy, MICROSCOPY AND MICROANALYSIS, Vol: 17, Pages: 226-239, ISSN: 1431-9276

Journal article

Hoummada K, Mangelinck D, Gault B, Cabie Met al., 2011, Nickel segregation on dislocation loops in implanted silicon, SCRIPTA MATERIALIA, Vol: 64, Pages: 378-381, ISSN: 1359-6462

Journal article

Mueller M, Gault B, Smith GDW, Grovenor CRMet al., 2011, Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis, 17th International Conference on Microscopy of Semiconducting Materials, Publisher: AMER INST PHYSICS, ISSN: 1742-6588

Conference paper

Gault B, Marquis EA, Saxey DW, Hughes GM, Mangelinck D, Toberer ES, Snyder GJet al., 2010, High-resolution nanostructural investigation of Zn<sub>4</sub>Sb<sub>3</sub> alloys, SCRIPTA MATERIALIA, Vol: 63, Pages: 784-787, ISSN: 1359-6462

Journal article

Gault B, Mueller M, La Fontaine A, Moody MP, Shariq A, Cerezo A, Ringer SP, Smith GDWet al., 2010, Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography, Publisher: AMER INST PHYSICS, ISSN: 0021-8979

Conference paper

Gault B, La Fontaine A, Moody MP, Ringer SP, Marquis EAet al., 2010, Impact of laser pulsing on the reconstruction in an atom probe tomography, ULTRAMICROSCOPY, Vol: 110, Pages: 1215-1222, ISSN: 0304-3991

Journal article

Tang F, Gault B, Ringer SP, Martin P, Bendavid A, Cairney JMet al., 2010, Microstructural investigation of Ti-Si-N hard coatings, SCRIPTA MATERIALIA, Vol: 63, Pages: 192-195, ISSN: 1359-6462

Journal article

Tang F, Gault B, Ringer SP, Cairney JMet al., 2010, Optimization of pulsed laser atom probe (PLAP) for the analysis of nanocomposite Ti-Si-N films, ULTRAMICROSCOPY, Vol: 110, Pages: 836-843, ISSN: 0304-3991

Journal article

Gault B, Yang W, Ratinac KR, Zheng R, Braet F, Ringer SPet al., 2010, Atom Probe Microscopy of Self-Assembled Monolayers: Preliminary Results, LANGMUIR, Vol: 26, Pages: 5291-5294, ISSN: 0743-7463

Journal article

Gault B, Moody MP, De Geuser F, La Fontaine A, Stephenson LT, Haley D, Ringer SPet al., 2010, Spatial resolution in atom probe tomography, Microscopy and Microanalysis, Vol: 16, Pages: 99-110, ISSN: 1431-9276

This article addresses gaps in definitions and a lack of standard measurement techniques to assess the spatial resolution in atom probe tomography. This resolution is known to be anisotropic, being better in-depth than laterally. Generally the presence of atomic planes in the tomographic reconstruction is considered as being a sufficient proof of the quality of the spatial resolution of the instrument. Based on advanced spatial distribution maps, an analysis methodology that interrogates the local neighborhood of the atoms within the tomographic reconstruction, it is shown how both the in-depth and the lateral resolution can be quantified. The influences of the crystallography and the temperature are investigated, and models are proposed to explain the observed results. We demonstrate that the absolute value of resolution is specimen specific.

Journal article

Yao L, Gault B, Cairney JM, Ringer SPet al., 2010, On the multiplicity of field evaporation events in atom probe: A new dimension to the analysis of mass spectra, PHILOSOPHICAL MAGAZINE LETTERS, Vol: 90, Pages: 121-129, ISSN: 0950-0839

Journal article

Tang F, Alam T, Moody MP, Gault B, Cairney JMet al., 2010, Challenges Associated with the Characterisation of Nanocrystalline Materials using Atom Probe Tomography, 7th Pacific Rim International Conference on Advanced Materials and Processing, Publisher: TRANS TECH PUBLICATIONS LTD, Pages: 2366-+, ISSN: 0255-5476

Conference paper

Gault B, Moody MP, de Geuser F, Haley D, Stephenson LT, Ringer SPet al., 2009, Origin of the spatial resolution in atom probe microscopy, APPLIED PHYSICS LETTERS, Vol: 95, ISSN: 0003-6951

Journal article

Moody MP, Gault B, Stephenson LT, Ringer SPet al., 2009, Applications of spatial distribution maps for advanced atom probe reconstruction and data analysis, Microscopy and Microanalysis, Vol: 15, Pages: 246-247, ISSN: 1431-9276

  • Cite
  • Citations: 10
Journal article

Gault B, Yang W, Ratinac KR, Zheng R, Braet F, Ringer SPet al., 2009, Investigation of Self-Assembled Monolayer by Atom Probe Microscopy, MICROSCOPY AND MICROANALYSIS, Vol: 15, Pages: 272-273, ISSN: 1431-9276

Journal article

Ulfig RM, Kelly TF, Gault B, 2009, Promoting Standards in Quantitative Atom Probe Tomography Analysis, MICROSCOPY AND MICROANALYSIS, Vol: 15, Pages: 260-261, ISSN: 1431-9276

Journal article

Gault B, Moody MP, Marquis EA, de Geuser F, Geiser BP, Larson DJ, Kelly TF, Ringer SP, Smith GDWet al., 2009, Tomographic Reconstruction in Atom Probe Microscopy: Past, Present ... Future?, MICROSCOPY AND MICROANALYSIS, Vol: 15, Pages: 10-11, ISSN: 1431-9276

Journal article

Yeh CY, Lai WC, Hsueh TH, Yang YY, Sheu JK, Ringer SP, Gault Bet al., 2009, Light Output Improvement of Oxide-Textured InGaN-Based Light-Emitting Diodes by Bias-Assisted Photoelectrochemical Oxidation With Imprint Technique, IEEE PHOTONICS TECHNOLOGY LETTERS, Vol: 21, Pages: 718-720, ISSN: 1041-1135

Journal article

Moody MP, Gault B, Stephenson LT, Haley D, Ringer SPet al., 2009, Qualification of the tomographic reconstruction in atom probe by advanced spatial distribution map techniques, ULTRAMICROSCOPY, Vol: 109, Pages: 815-824, ISSN: 0304-3991

Journal article

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