Imperial College London
Portrait Picture

ProfessorBaptisteGault

Faculty of Engineering, Department of Materials

Professor of Atomic-Scale Characterization
 
 
 
//

Contact

 

b.gault

 
 
//

Location

 

Royal School of MinesSouth Kensington Campus

//

Summary

 

Publications

Citation

BibTex format

@article{Kim:2020:10.1002/adma.201907235,
author = {Kim, S-H and Lim, J and Sahu, R and Kasian, O and Stephenson, LT and Scheu, C and Gault, B},
doi = {10.1002/adma.201907235},
journal = {ADVANCED MATERIALS},
title = {Direct Imaging of Dopant and Impurity Distributions in 2D MoS<sub>2</sub>},
url = {http://dx.doi.org/10.1002/adma.201907235},
volume = {32},
year = {2020}
}
Download

RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Kim,S-H
AU  - Lim,J
AU  - Sahu,R
AU  - Kasian,O
AU  - Stephenson,LT
AU  - Scheu,C
AU  - Gault,B
DO  - 10.1002/adma.201907235
PY  - 2020///
SN  - 0935-9648
TI  - Direct Imaging of Dopant and Impurity Distributions in 2D MoS<sub>2</sub>
T2  - ADVANCED MATERIALS
UR  - http://dx.doi.org/10.1002/adma.201907235
UR  - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000506676900001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
VL  - 32
ER  -
Download