Imperial College London
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ProfessorChristopherGourlay

Faculty of Engineering, Department of Materials

Professor of Physical Metallurgy
 
 
 
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Contact

 

+44 (0)20 7594 8707c.gourlay

 
 
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Location

 

301DBessemer BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Gu:2019:10.1007/s11664-018-6744-1,
author = {Gu, T and Gourlay, C and Britton, T},
doi = {10.1007/s11664-018-6744-1},
journal = {Journal of Electronic Materials},
pages = {107--121},
title = {Evaluating creep deformation in controlled microstructures of Sn-3Ag-0.5Cu solder},
url = {http://dx.doi.org/10.1007/s11664-018-6744-1},
volume = {48},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - The reliability of solder joints is affected significantly by thermomechanical properties such as creep and thermal fatigue. In this work, the creep of directionally solidified (DS) Sn-3Ag-0.5Cu wt.% (SAC305) dog-bone samples (gauge dimension: 10 × 2 × 1.5 mm) with a controlled <110> or <100> fibre texture is investigated under constant load testing (stress level: ∼ 30 MPa) at a range of temperatures from 20°C to 200°C. Tensile testing is performed and the secondary creep strain rate and the localised strain gradient are studied by two-dimensional optical digital image correlation (2-D DIC). The dominating creep mechanisms and their temperature dependence are explored at the microstructural scale using electron backscatter diffraction (EBSD), which enables the understanding of the microstructural heterogeneity of creep mechanisms at different strain levels, temperatures and strain rates. Formation of subgrains and the development of recrystallization are observed with increasing strain levels. Differences in the deformation of β-Sn in dendrites and in the eutectic regions containing Ag3Sn and Cu6Sn5 are studied and related to changes in local deformation mechanisms.
AU  - Gu,T
AU  - Gourlay,C
AU  - Britton,T
DO  - 10.1007/s11664-018-6744-1
EP  - 121
PY  - 2019///
SN  - 0361-5235
SP  - 107
TI  - Evaluating creep deformation in controlled microstructures of Sn-3Ag-0.5Cu solder
T2  - Journal of Electronic Materials
UR  - http://dx.doi.org/10.1007/s11664-018-6744-1
UR  - http://hdl.handle.net/10044/1/65549
VL  - 48
ER  -
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