Imperial College London
Portrait Picture

Dr Christos Papavassiliou

Faculty of Engineering, Department of Electrical and Electronic Engineering

Reader in Instrumentation Electronics
 
 
 
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Contact

 

+44 (0)20 7594 6325c.papavas Website

 
 
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Assistant

 

Mrs Wiesia Hsissen +44 (0)20 7594 6261

 
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Location

 

915Electrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Foster:2022:10.1038/s41598-022-18100-3,
author = {Foster, P and Huang, J and Serb, A and Stathopoulos, S and Papavassiliou, C and Prodromakis, T},
doi = {10.1038/s41598-022-18100-3},
journal = {Scientific Reports},
title = {An FPGA-based system for generalised electron devices testing},
url = {http://dx.doi.org/10.1038/s41598-022-18100-3},
volume = {12},
year = {2022}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Electronic systems are becoming more and more ubiquitous as our world digitises. Simultaneously, even basic components are experiencing a wave of improvements with new transistors, memristors, voltage/current references, data converters, etc, being designed every year by hundreds of R &D groups world-wide. To date, the workhorse for testing all these designs has been a suite of lab instruments including oscilloscopes and signal generators, to mention the most popular. However, as components become more complex and pin numbers soar, the need for more parallel and versatile testing tools also becomes more pressing. In this work, we describe and benchmark an FPGA system developed that addresses this need. This general purpose testing system features a 64-channel source-meter unit, and [Formula: see text] banks of 32 digital pins for digital I/O. We demonstrate that this bench-top system can obtain [Formula: see text] current noise floor, [Formula: see text] pulse delivery at [Formula: see text] and [Formula: see text] maximum current drive/channel. We then showcase the instrument's use in performing a selection of three characteristic measurement tasks: (a) current-voltage characterisation of a diode and a transistor, (b) fully parallel read-out of a memristor crossbar array and (c) an integral non-linearity test on a DAC. This work introduces a down-scaled electronics laboratory packaged in a single instrument which provides a shift towards more affordable, reliable, compact and multi-functional instrumentation for emerging electronic technologies.
AU  - Foster,P
AU  - Huang,J
AU  - Serb,A
AU  - Stathopoulos,S
AU  - Papavassiliou,C
AU  - Prodromakis,T
DO  - 10.1038/s41598-022-18100-3
PY  - 2022///
SN  - 2045-2322
TI  - An FPGA-based system for generalised electron devices testing
T2  - Scientific Reports
UR  - http://dx.doi.org/10.1038/s41598-022-18100-3
UR  - https://www.ncbi.nlm.nih.gov/pubmed/35978029
UR  - http://hdl.handle.net/10044/1/99335
VL  - 12
ER  -
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