Imperial College London

Dr Catriona M. McGilvery

Faculty of EngineeringDepartment of Materials

Research Facility Manager (Microscopy)
 
 
 
//

Contact

 

+44 (0)20 7594 2579catriona.mcgilvery

 
 
//

Location

 

LGM 05KRoyal School of MinesSouth Kensington Campus

//

Summary

 

Publications

Citation

BibTex format

@inproceedings{Docherty:2008:10.1016/j.mee.2007.03.001,
author = {Docherty, FT and MacKenzie, M and Craven, AJ and McComb, DW and De, Gendt S and McFadzean, S and McGilvery, CM},
doi = {10.1016/j.mee.2007.03.001},
pages = {61--64},
publisher = {ELSEVIER},
title = {A nanoanalytical investigation of elemental distributions in high-<i>k</i> dielectric gate stacks on silicon},
url = {http://dx.doi.org/10.1016/j.mee.2007.03.001},
year = {2008}
}

RIS format (EndNote, RefMan)

TY  - CPAPER
AU - Docherty,FT
AU - MacKenzie,M
AU - Craven,AJ
AU - McComb,DW
AU - De,Gendt S
AU - McFadzean,S
AU - McGilvery,CM
DO - 10.1016/j.mee.2007.03.001
EP - 64
PB - ELSEVIER
PY - 2008///
SN - 0167-9317
SP - 61
TI - A nanoanalytical investigation of elemental distributions in high-<i>k</i> dielectric gate stacks on silicon
UR - http://dx.doi.org/10.1016/j.mee.2007.03.001
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000253030100012&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
ER -