Imperial College London

Dr Catriona M. McGilvery

Faculty of EngineeringDepartment of Materials

Research Facility Manager (Microscopy)
 
 
 
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Contact

 

+44 (0)20 7594 2579catriona.mcgilvery

 
 
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Location

 

LGM 05KRoyal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@inproceedings{McGilvery:2008:1/012003,
author = {McGilvery, CM and McComb, DW and MacKenzie, M and Craven, AJ and McFadzean, S and De, Gendt S},
doi = {1/012003},
publisher = {IOP PUBLISHING LTD},
title = {Analysis of hafnium containing powders and thin films for CMOS device applications},
url = {http://dx.doi.org/10.1088/1742-6596/126/1/012003},
year = {2008}
}

RIS format (EndNote, RefMan)

TY  - CPAPER
AU - McGilvery,CM
AU - McComb,DW
AU - MacKenzie,M
AU - Craven,AJ
AU - McFadzean,S
AU - De,Gendt S
DO - 1/012003
PB - IOP PUBLISHING LTD
PY - 2008///
SN - 1742-6588
TI - Analysis of hafnium containing powders and thin films for CMOS device applications
UR - http://dx.doi.org/10.1088/1742-6596/126/1/012003
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000263476400003&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
ER -