Imperial College London

Professor David W. McComb

Faculty of EngineeringDepartment of Materials

Adjunct Professor
 
 
 
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Contact

 

+44 (0)20 7594 6750d.mccomb Website

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Williams:2020:10.1017/S1431927620024034,
author = {Williams, R and Bagues, N and Farghadany, E and Sehirlioglu, A and McComb, D},
doi = {10.1017/S1431927620024034},
journal = {Microscopy and Microanalysis},
title = {Characterization of nano-scale defects in pulsed laser deposited (PLD) thin films of Li<inf>3x</inf>Nd<inf>(2/3-x)(1/3-2x)</inf>TiO3 (NLTO) by aberration corrected HR-STEM imaging and dual-EELS},
url = {http://dx.doi.org/10.1017/S1431927620024034},
year = {2020}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AU - Williams,R
AU - Bagues,N
AU - Farghadany,E
AU - Sehirlioglu,A
AU - McComb,D
DO - 10.1017/S1431927620024034
PY - 2020///
SN - 1431-9276
TI - Characterization of nano-scale defects in pulsed laser deposited (PLD) thin films of Li<inf>3x</inf>Nd<inf>(2/3-x)(1/3-2x)</inf>TiO3 (NLTO) by aberration corrected HR-STEM imaging and dual-EELS
T2 - Microscopy and Microanalysis
UR - http://dx.doi.org/10.1017/S1431927620024034
ER -