Publications
195 results found
Breton G, Woods N, Graoui H, et al., 2000, Selective and non-selective growth by GSMBE/ULPCVD for heterojunction bipolar transistors, Spring Meeting of the European-Materials-Research-Society, Publisher: ELSEVIER SCIENCE SA, Pages: 120-123, ISSN: 0040-6090
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- Citations: 1
Zheng YJ, Engstrom JR, Zhang J, et al., 2000, The effect of coincident atomic hydrogen on the gas-source molecular beam epitaxial growth of silicon from disilane, SURFACE SCIENCE, Vol: 470, Pages: 131-140, ISSN: 0039-6028
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- Citations: 11
Steans PH, Neave JH, Bell GR, et al., 2000, A new mechanism for reentrant behaviour in semiconductor epitaxy: a reflection high-energy electron diffraction study of the growth of GaAs(111)A thin films, SURFACE SCIENCE, Vol: 459, Pages: 277-286, ISSN: 0039-6028
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- Citations: 3
Miura M, Hartmann JM, Zhang J, et al., 2000, Formation process and ordering of self-assembled Ge islands, 1st Joint Conference on Silicon Epitaxy and Heterostructures (UC-Si), Publisher: ELSEVIER SCIENCE SA, Pages: 104-107, ISSN: 0040-6090
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- Citations: 16
Hartmann JM, Gallas B, Ferguson R, et al., 2000, Gas-source molecular beam epitaxy of SiGe virtual substrates:: I.: Growth kinetics and doping, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, Vol: 15, Pages: 362-369, ISSN: 0268-1242
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- Citations: 22
Hartmann JM, Gallas B, Zhang J, et al., 2000, Gas-source molecular beam epitaxy of SiGe virtual substrates: II. Strain relaxation and surface morphology, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, Vol: 15, Pages: 370-377, ISSN: 0268-1242
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- Citations: 54
Tok ES, Price RW, Taylor AG, et al., 2000, Oscillatory optical second-harmonic generation from Si(001) surface during thin-film epitaxy, APPLIED PHYSICS LETTERS, Vol: 76, Pages: 933-935, ISSN: 0003-6951
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- Citations: 2
Tok ES, Woods NJ, Zhang J, 2000, RHEED and SIMS studies of germanium segregation during growth of SiGe/Si heterostructures; a two-site exchange model with growth rate dependence, 7th International Conference on Chemical Beam Epitaxy and Related Growth Techniques (ICCBE-7), Publisher: ELSEVIER SCIENCE BV, Pages: 321-326, ISSN: 0022-0248
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- Citations: 29
Price RW, Tok ES, Zhang J, 2000, Probing the silane, disilane and germane adsorption kinetics on the silicon (001) surface, 7th International Conference on Chemical Beam Epitaxy and Related Growth Techniques (ICCBE-7), Publisher: ELSEVIER, Pages: 306-310, ISSN: 0022-0248
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- Citations: 16
Tok ES, Woods NJ, Price RW, et al., 2000, Optical second harmonic generation studies of epitaxial growth of Si and SiGe, 7th International Conference on Chemical Beam Epitaxy and Related Growth Techniques (ICCBE-7), Publisher: ELSEVIER SCIENCE BV, Pages: 297-301, ISSN: 0022-0248
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- Citations: 1
Ekins-Daukes NJ, Zhang J, Bushnell DB, et al., 2000, Strain-balanced materials for high-efficiency solar cells, 28th IEEE Photovoltaic Specialists Conference, Publisher: IEEE, Pages: 1273-1276, ISSN: 0160-8371
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- Citations: 13
Zhang J, Tok ES, Breton G, et al., 2000, Thin film epitaxy on Si for microelectronics, Conference on Advanced Microelectronic Processing Techniques, Publisher: SPIE-INT SOC OPTICAL ENGINEERING, Pages: 1-8, ISSN: 0277-786X
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- Citations: 1
Gallas B, Hartmann JM, Breton G, et al., 1999, Influence of doping on facet formation at the SiO<sub>2</sub>/Si interface, SURFACE SCIENCE, Vol: 440, Pages: 41-48, ISSN: 0039-6028
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- Citations: 5
Hartmann JM, Gallas B, Zhang J, et al., 1999, Strain-balanced Si SiGe short period superlattices: Disruption of the surface crosshatch, JOURNAL OF APPLIED PHYSICS, Vol: 86, Pages: 845-849, ISSN: 0021-8979
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- Citations: 19
Gallas B, Hartmann JM, Berbezier I, et al., 1999, Influence of misfit and threading dislocations on the surface morphology of SiGe graded-layers, 10th International Conference on Molecular Beam Epitaxy (MBE-X), Publisher: ELSEVIER SCIENCE BV, Pages: 547-550, ISSN: 0022-0248
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- Citations: 26
Steans PH, Neave JH, Zhang J, et al., 1999, Re-entrant behaviour in GaAs(111)A homoepitaxy, 10th International Conference on Molecular Beam Epitaxy (MBE-X), Publisher: ELSEVIER SCIENCE BV, Pages: 198-201, ISSN: 0022-0248
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- Citations: 4
Price RW, Tok ES, Zhang J, 1999, Probing the disilane adsorption kinetics: An alternative approach, PHYSICAL REVIEW B, Vol: 59, Pages: R5292-R5295, ISSN: 1098-0121
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- Citations: 17
Zhang J, Lees AK, Schellinger A, et al., 1998, Kinetics and dynamics of Si GSMBE studied by reflectance anisotropy spectroscopy, 17th European Conference on Surface Science, Publisher: ELSEVIER SCIENCE BV, Pages: 480-486, ISSN: 0039-6028
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- Citations: 5
Xie MH, Zhang J, Fernandez JM, et al., 1998, Arsenic doping kinetics in silicon during gas source molecular beam epitaxy, SURFACE SCIENCE, Vol: 397, Pages: 164-169, ISSN: 0039-6028
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- Citations: 15
Joyce BA, Zhang J, Taylor AG, et al., 1998, A reflection high energy electron diffraction-reflectance anisotropy spectroscopy study of silicon growth dynamics during gas source molecular beam epitaxy from silanes, Surface Review and Letters, Vol: 5, Pages: 761-767, ISSN: 0218-625X
Tok ES, Jones TS, Neave JH, et al., 1997, Is the arsenic incorporation kinetics important when growing GaAs(001), (110), and (111)A films?, APPLIED PHYSICS LETTERS, Vol: 71, Pages: 3278-3280, ISSN: 0003-6951
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- Citations: 42
Tok ES, Neave JH, Fahy MR, et al., 1997, Influence of arsenic incorporation on surface morphology and Si doping in GaAs(110) homoepitaxy, 2nd International Workshop on Growth, Characterization and Exploitation of Epitaxial Compound Semiconductor on Novel Index Surfaces (NIS 96), Publisher: ELSEVIER ADVANCED TECHNOLOGY, Pages: 833-839, ISSN: 0026-2692
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- Citations: 10
Zhang J, Naji OP, Steans P, et al., 1997, Modulated-beam studies of the layer-by-layer etching of GaAs(001) using AsBr3: identification of the reaction mechanism, 9th International Conference on Molecular Beam Epitaxy (MBE-IX), Publisher: ELSEVIER SCIENCE BV, Pages: 1284-1288, ISSN: 0022-0248
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- Citations: 10
Mizushima K, Vvedensky DD, Smilauer P, et al., 1997, Effect of hydrogen on the growth kinetics of Si(001) during GSMBE from disilane, 9th International Conference on Molecular Beam Epitaxy (MBE-IX), Publisher: ELSEVIER SCIENCE BV, Pages: 509-513, ISSN: 0022-0248
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- Citations: 5
Xie MH, Lees AK, Fernandez JM, et al., 1997, Arsenic surface segregation and incorporation in Si and Si1-xGex during gas source molecular beam epitaxy, JOURNAL OF CRYSTAL GROWTH, Vol: 173, Pages: 336-342, ISSN: 0022-0248
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- Citations: 17
Tok ES, Neave JH, Zhang J, et al., 1997, Arsenic incorporation kinetics in GaAs(001) homoepitaxy revisited, SURFACE SCIENCE, Vol: 374, Pages: 397-405, ISSN: 0039-6028
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- Citations: 79
Tok ES, Neave JH, Allegretti FE, et al., 1997, Incorporation kinetics of As-2 and As-4 on GaAs(110), SURFACE SCIENCE, Vol: 371, Pages: 277-288, ISSN: 0039-6028
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- Citations: 39
Xie MH, Zhang J, Lees A, et al., 1996, Surface segregation during molecular beam epitaxy: The site-blocking effects of surfactant atoms, SURFACE SCIENCE, Vol: 367, Pages: 231-237, ISSN: 0039-6028
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- Citations: 22
Fernandez JM, Hart L, Zhang XM, et al., 1996, Epitaxial growth mode and silicon/silicon-germanium heterointerfaces, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, Vol: 7, Pages: 321-325, ISSN: 0957-4522
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- Citations: 2
Fernandez JM, Hart L, Zhang XM, et al., 1996, Silicon/silicon-germanium multiple quantum wells grown by gas-source molecular beam epitaxy: Hydrogen coverage and interfacial abruptness, 5th International Conference on Chemical Beam Epitaxy and Related Growth Techniques (ICCBE-5), Publisher: ELSEVIER SCIENCE BV, Pages: 241-247, ISSN: 0022-0248
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- Citations: 14
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