Group
In our group, we apply microstructural characterization techniques from cm to nm scales. Our work is generally experimental and ranges from investigating the role of interfaces for the control of material properties, diffusive transport in materials, and the use and enhancement of advanced materials characterization. To correlate information across scales we employ visual light microscopy, scanning electron microscopy (SEM), electron backscatter diffraction (EBSD) to advanced high-resolution transmission electron microscopy (HRTEM), and scanning transmission electron microscopy (STEM) and atomic force microscopy (AFM). We cross-correlated information in time and space to access microstructural properties.
Group foto from October 2021