BibTex format
@inproceedings{CHITAREE:1995:10.1117/12.221105,
author = {CHITAREE, R and MURPHY, V and WEIR, K and PALMER, AW and GRATTAN, KTV and MACCRAITH, BD},
doi = {10.1117/12.221105},
pages = {72--78},
publisher = {SPIE - INT SOC OPTICAL ENGINEERING},
title = {Ellipsometric measurements for thin film based sensor systems},
url = {http://dx.doi.org/10.1117/12.221105},
year = {1995}
}