Imperial College London
Portrait Picture

ProfessorMichaelLowe

Faculty of Engineering, Department of Mechanical Engineering

Head of Department of Mechanical Engineering
 
 
 
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Contact

 

+44 (0)20 7594 7000m.lowe Website

 
 
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Assistant

 

Ms Nina Hancock +44 (0)20 7594 7068

 
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Location

 

577DCity and Guilds BuildingSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Haslinger:2020:10.1016/j.jmps.2019.103852,
author = {Haslinger, SG and Lowe, MJS and Huthwaite, P and Craster, RV and Shi, F},
doi = {10.1016/j.jmps.2019.103852},
journal = {Journal of the Mechanics and Physics of Solids},
pages = {1--20},
title = {Elastic shear wave scattering by randomly rough surfaces},
url = {http://dx.doi.org/10.1016/j.jmps.2019.103852},
volume = {137},
year = {2020}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Characterizing cracks within elastic media forms an important aspect of ultrasonic non-destructive evaluation (NDE) where techniques such as time-of-flight diffraction and pulse-echo are often used with the presumption of scattering from smooth, straight cracks. However, cracks are rarely straight, or smooth, and recent attention has focussed upon rough surface scattering primarily by longitudinal wave excitations.We provide a comprehensive study of scattering by incident shear waves, thus far neglected in models of rough surface scattering despite their practical importance in the detection of surface-breaking defects, using modelling, simulation and supporting experiments. The scattering of incident shear waves introduces challenges, largely absent in the longitudinal case, related to surface wave mode-conversion, the reduced range of validity of the Kirchhoff approximation (KA) as compared with longitudinal incidence, and an increased importance of correlation length.The expected reflection from a rough defect is predicted using a statistical model from which, given the angle of incidence and two statistical parameters, the expected reflection amplitude is obtained instantaneously for any scattering angle and length of defect. If the ratio of correlation length to defect length exceeds a critical value, which we determine, there is an explicit dependence of the scattering results on correlation length, and we modify the modelling to find this dependence. The modelling is cross-correlated against Monte Carlo simulations of many different surface profiles, sharing the same statistical parameter values, using numerical simulation via ray models (KA) and finite element (FE) methods accelerated with a GPU implementation. Additionally we provide experimental validations that demonstrate the accuracy of our predictions.
AU  - Haslinger,SG
AU  - Lowe,MJS
AU  - Huthwaite,P
AU  - Craster,RV
AU  - Shi,F
DO  - 10.1016/j.jmps.2019.103852
EP  - 20
PY  - 2020///
SN  - 0022-5096
SP  - 1
TI  - Elastic shear wave scattering by randomly rough surfaces
T2  - Journal of the Mechanics and Physics of Solids
UR  - http://dx.doi.org/10.1016/j.jmps.2019.103852
UR  - https://www.sciencedirect.com/science/article/pii/S0022509619307835?via%3Dihub
UR  - http://hdl.handle.net/10044/1/77360
VL  - 137
ER  -
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