Imperial College London

ProfessorNeilAlford

Central FacultyOffice of the Provost

Associate Provost (Academic Planning)
 
 
 
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Contact

 

+44 (0)20 7594 6724n.alford

 
 
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Assistant

 

Miss Catherine Graham +44 (0)20 7594 3330

 
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Location

 

2..05 (in RSM) or 3.09 (in the Faculty Building)Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@inproceedings{Krupka:2006:10.1109/MIKON.2006.4345377,
author = {Krupka, J and Breeze, J and Alford, NMN and Centeno, AE and Jensen, L and Claussen, T},
doi = {10.1109/MIKON.2006.4345377},
title = {Measurements of permittivity and dielectric loss tangent of high resistivity float zone silicon at microwave frequencies},
url = {http://dx.doi.org/10.1109/MIKON.2006.4345377},
year = {2006}
}

RIS format (EndNote, RefMan)

TY  - CPAPER
AB - Real part of permittivity and the dielectric loss tangent of float zone high resistivity Silicon were measured at microwave frequencies at temperatures from 10 K up to 380 K employing dielectric resonator technique. The real part of permittivity proved to be frequency independent and the decrease in dielectric loss tangent versus frequency proved to be not entirely proportional to the inverse of frequency. At temperatures below 25 K where all free carriers are frozen-out loss tangents values the order of 10-4 were measured.
AU - Krupka,J
AU - Breeze,J
AU - Alford,NMN
AU - Centeno,AE
AU - Jensen,L
AU - Claussen,T
DO - 10.1109/MIKON.2006.4345377
PY - 2006///
TI - Measurements of permittivity and dielectric loss tangent of high resistivity float zone silicon at microwave frequencies
UR - http://dx.doi.org/10.1109/MIKON.2006.4345377
ER -