Imperial College London

ProfessorPaulKelly

Faculty of EngineeringDepartment of Computing

Professor of Software Technology
 
 
 
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Contact

 

+44 (0)20 7594 8332p.kelly Website

 
 
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Location

 

Level 3 (upstairs), William Penney Building, room 304William Penney LaboratorySouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Koch:2022:10.1109/tvcg.2021.3074438,
author = {Koch, MK and Kelly, PHJ and Vincent, P},
doi = {10.1109/tvcg.2021.3074438},
journal = {IEEE Transactions on Visualization and Computer Graphics},
pages = {5178--5180},
title = {Identification and classification of off-vertex critical points for contour tree construction on unstructured meshes of hexahedra},
url = {http://dx.doi.org/10.1109/tvcg.2021.3074438},
volume = {28},
year = {2022}
}

RIS format (EndNote, RefMan)

TY  - JOUR
AB - The topology of isosurfaces changes at isovalues of critical points, making such points an important feature when building contour trees or Morse-Smale complexes. Hexahedral elements with linear interpolants can contain additional off-vertex critical points in element bodies and on element faces. Moreover, a point on the face of a hexahedron which is critical in the element-local context is not necessarily critical in the global context. In ‘`Exploring Scalar Fields Using Critical Isovalues’' Weber et al. introduce a method to determine whether critical points on faces are also critical in the global context, based on the gradient of the asymptotic decider in each element that shares the face. However, as defined, the method of Weber et al. contains an error, and can lead to incorrect results. In this work we correct the error.
AU - Koch,MK
AU - Kelly,PHJ
AU - Vincent,P
DO - 10.1109/tvcg.2021.3074438
EP - 5180
PY - 2022///
SN - 1077-2626
SP - 5178
TI - Identification and classification of off-vertex critical points for contour tree construction on unstructured meshes of hexahedra
T2 - IEEE Transactions on Visualization and Computer Graphics
UR - http://dx.doi.org/10.1109/tvcg.2021.3074438
UR - https://ieeexplore.ieee.org/document/9409737
UR - http://hdl.handle.net/10044/1/88409
VL - 28
ER -