Publications
131 results found
Torok P, Higdon PD, Juskaitis R, et al., 1998, Optimising the image contrast of conventional and confocal optical microscopes imaging finite sized spherical gold scatterers, OPTICS COMMUNICATIONS, Vol: 155, Pages: 335-341, ISSN: 0030-4018
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- Citations: 28
Wiersma SH, Visser TD, Torok P, 1998, Annular focusing through a dielectric interface: scanning and confining the intensity, PURE AND APPLIED OPTICS, Vol: 7, Pages: 1237-1248, ISSN: 0963-9659
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- Citations: 12
Torok P, Higdon PD, Wilson T, 1998, Theory for confocal and conventional microscopes imaging small dielectric scatterers, 9th Conference on Coherent Laser Radar, Publisher: TAYLOR & FRANCIS LTD, Pages: 1681-1698, ISSN: 0950-0340
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- Citations: 77
Varga P, Torok P, 1998, The Gaussian wave solution of Maxwell's equations and the validity of scalar wave approximation, OPTICS COMMUNICATIONS, Vol: 152, Pages: 108-118, ISSN: 0030-4018
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- Citations: 80
Torok P, Higdon PD, Wilson T, 1998, On the general properties of polarised light conventional and confocal microscopes, OPTICS COMMUNICATIONS, Vol: 148, Pages: 300-315, ISSN: 0030-4018
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- Citations: 91
Wiersma SH, Visser TD, Torok P, 1998, Focusing through an interface: scanning and localizing the intensity, OPTICS LETTERS, Vol: 23, Pages: 415-417, ISSN: 0146-9592
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- Citations: 4
Wilson T, Török P, Higdon PD, 1998, The effect of detector size on the signal-to-noise ratio in confocal polarized light microscopy, JOURNAL OF MICROSCOPY-OXFORD, Vol: 189, Pages: 12-14, ISSN: 0022-2720
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- Citations: 5
Varga P, Torok P, 1998, The electromagnetic field in optics, International Conference on Applied Optical Metrology, Publisher: SPIE-INT SOC OPTICAL ENGINEERING, Pages: 273-275, ISSN: 0277-786X
Torok P, Higdon PD, Wilson T, 1998, Polarised light microscopy, Conference on 3-Dimensional and Multidimensional Microscopy - Image Acquisition and Processing V, Publisher: SPIE-INT SOC OPTICAL ENGINEERING, Pages: 22-26, ISSN: 0277-786X
Torok P, Stagno LM, 1998, Scanning optical microscopy and its applications to non-destructive materials testing, International Conference on Applied Optical Metrology, Publisher: SPIE-INT SOC OPTICAL ENGINEERING, Pages: 418-422, ISSN: 0277-786X
Török P, Hewlett SJ, Varga P, 1997, The role of specimen-induced spherical aberration in confocal microscopy, JOURNAL OF MICROSCOPY-OXFORD, Vol: 188, Pages: 158-172, ISSN: 0022-2720
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- Citations: 58
Torok P, Mulestagno L, 1997, Applications of scanning optical microscopy in materials science to detect bulk microdefects in semiconductors, JOURNAL OF MICROSCOPY-OXFORD, Vol: 188, Pages: 1-16, ISSN: 0022-2720
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- Citations: 17
Wiersma SH, Torok P, Visser TD, et al., 1997, Comparison of different theories for focusing through a plane interface, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 14, Pages: 1482-1490, ISSN: 0740-3232
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- Citations: 74
Torok P, Wilson T, 1997, Rigorous theory for axial resolution in confocal microscopes, OPTICS COMMUNICATIONS, Vol: 137, Pages: 127-135, ISSN: 0030-4018
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- Citations: 49
Torok P, Varga P, 1997, Electromagnetic diffraction of light focused through a stratified medium, APPLIED OPTICS, Vol: 36, Pages: 2305-2312, ISSN: 0003-6935
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- Citations: 99
Sheppard CJR, Torok P, 1997, Approximate forms for diffraction integrals in high numerical aperture focusing, OPTIK, Vol: 105, Pages: 77-82, ISSN: 0030-4026
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- Citations: 10
Sheppard CJR, Torok P, 1997, Efficient calculation of electromagnetic diffraction in optical systems using a multipole expansion, JOURNAL OF MODERN OPTICS, Vol: 44, Pages: 803-818, ISSN: 0950-0340
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- Citations: 70
Sheppard CJR, Torok P, 1997, Effects of specimen refractive index on confocal imaging, JOURNAL OF MICROSCOPY-OXFORD, Vol: 185, Pages: 366-374, ISSN: 0022-2720
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- Citations: 88
Torok P, Hewlett SJ, Varga P, 1997, On the series expansion of high-aperture, vectorial diffraction integrals, JOURNAL OF MODERN OPTICS, Vol: 44, Pages: 493-503, ISSN: 0950-0340
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- Citations: 10
Sheppard CJR, Torok P, 1997, Electromagnetic field in the focal region of an electric dipole wave, OPTIK, Vol: 104, Pages: 175-177, ISSN: 0030-4026
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- Citations: 39
MuleStagno L, Bazzali A, Olmo M, et al., 1997, The scanning infra-red microscope: An alternative tool to measure bulk micro-defect density in semiconductors., Symposium on Crystalline Defects and Contamination, at 192nd Meeting of Electrochemical Society Inc / 48th Annual Meeting of International Society of Electrochemistry, Publisher: ELECTROCHEMICAL SOCIETY INC, Pages: 431-437
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- Citations: 1
Mule'Stagno L, Bazzali A, Olmo M, et al., 1997, Non-destructive measurement of bulk inhomogeneities in silicon using the scanning infra-red microscope, Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 689-692, ISSN: 0951-3248
Torok P, Laczik Z, Sheppard CJR, 1996, Effect of half-stop lateral misalignment on imaging of dark-field and stereoscopic confocal microscopes, APPLIED OPTICS, Vol: 35, Pages: 6732-6739, ISSN: 0003-6935
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- Citations: 9
Torok P, Varga P, Konkol A, et al., 1996, Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: Structure of the electromagnetic field .2., JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, Vol: 13, Pages: 2232-2238, ISSN: 0740-3232
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- Citations: 38
Varga P, Torok P, 1996, Exact and approximate solutions of Maxwell's equations for a confocal cavity, OPTICS LETTERS, Vol: 21, Pages: 1523-1525, ISSN: 0146-9592
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- Citations: 40
Torok P, Sheppard CJR, Laczik Z, 1996, Dark-field and differential phase contrast imaging modes in confocal microscopy using a half-aperture stop, OPTIK, Vol: 103, Pages: 101-106, ISSN: 0030-4026
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- Citations: 9
Torok P, Sheppard CJR, Varga P, 1996, Study of evanescent waves for transmission near-field optical microscopy, JOURNAL OF MODERN OPTICS, Vol: 43, Pages: 1167-1183, ISSN: 0950-0340
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- Citations: 26
Torok P, Laczik Z, Skepper JN, 1996, Simple modification of a commercial scanning laser microscope to incorporate dark-field imaging, JOURNAL OF MICROSCOPY-OXFORD, Vol: 181, Pages: 260-268, ISSN: 0022-2720
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- Citations: 8
Sheppard CJR, Torok P, 1996, A multipole expansion for efficient calculation of focal distributions, 2nd Iberoamerican Meeting on Optics, Publisher: SPIE - INT SOC OPTICAL ENGINEERING, Pages: 630-633
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- Citations: 2
Sheppard CJR, Torok P, 1996, Vectorial theory of confocal fluorescence, Conference on Three-Dimensional Microscopy - Image Acquisition and Processing III, Publisher: SPIE - INT SOC OPTICAL ENGINEERING, Pages: 26-32
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